Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test

被引：0

作者：

Ravelo, Blaise ^{[1
]}

Douyere, Alexandre ^{[2
]}

Liu, Yang ^{[3
]}

Rahajandraibe, Wenceslas ^{[4
]}

Wan, Fayu ^{[5
]}

Chan, George ^{[6
]}

Guerin, Mathieu ^{[4
]}

机构：

[1] Nanjing Univ Informat Sci & Technol NUIST, Nanjing 210044, Peoples R China

[2] Univ Reunion, Network & Telecom Team, Energy Lab, F-97400 Reun Isl, France

[3] Altran, F-78140 Velizy Villacoublay, France

[4] Univ Toulon & Var, Aix Marseille Univ, CNRS, IM2NP, F-13397 Marseille, France

[5] Nanjing Univ Informat Sci & Technol NUIST, Nanjing 210044, Peoples R China

[6] ASM Pacific Technol Ltd, Hong Kong, Peoples R China

来源：

IEEE DESIGN & TEST | 2023年 / 40卷 / 01期

关键词：

Integrated circuit modeling; Microstrip; Topology; Delays; Integrated circuit interconnections; RLC circuits; Mathematical models; Bandpass; Bandpass (BP) negative group delay (NGD); Modelling; Design and test; Three-port microstrip circuit; Transmission line (TL); Voltage transfer function (VTF); ELMORE DELAY; CLOCK; MODEL;

D O I：

10.1109/MDAT.2022.3164337

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This article presents design and test of three-port distributed circuit exhibiting double bandpass (BP) negative group delay (NGD) effect.

引用

页码：96 / 104

页数：9