Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test

被引：0
|
作者：
Ravelo, Blaise [1 ]
Douyere, Alexandre [2 ]
Liu, Yang [3 ]
Rahajandraibe, Wenceslas [4 ]
Wan, Fayu [5 ]
Chan, George [6 ]
Guerin, Mathieu [4 ]
机构：
[1] Nanjing Univ Informat Sci & Technol NUIST, Nanjing 210044, Peoples R China
[2] Univ Reunion, Network & Telecom Team, Energy Lab, F-97400 Reun Isl, France
[3] Altran, F-78140 Velizy Villacoublay, France
[4] Univ Toulon & Var, Aix Marseille Univ, CNRS, IM2NP, F-13397 Marseille, France
[5] Nanjing Univ Informat Sci & Technol NUIST, Nanjing 210044, Peoples R China
[6] ASM Pacific Technol Ltd, Hong Kong, Peoples R China
来源：
IEEE DESIGN & TEST | 2023年 / 40卷 / 01期
关键词：
Integrated circuit modeling; Microstrip; Topology; Delays; Integrated circuit interconnections; RLC circuits; Mathematical models; Bandpass; Bandpass (BP) negative group delay (NGD); Modelling; Design and test; Three-port microstrip circuit; Transmission line (TL); Voltage transfer function (VTF); ELMORE DELAY; CLOCK; MODEL;
D O I：
10.1109/MDAT.2022.3164337
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This article presents design and test of three-port distributed circuit exhibiting double bandpass (BP) negative group delay (NGD) effect.
引用
收藏
页码：96 / 104
页数：9
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