Intraband carrier relaxation in mid-infrared (3-4 μm) HgCdTe based structures: Effect of the carrier heating on the operating temperatures of bulk and quantum-well lasers

被引:3
作者
Kudryavtsev, K. E. [1 ]
Rumyantsev, V. V. [1 ]
Utochkin, V. V. [1 ]
Dubinov, A. A. [1 ]
Aleshkin, V. Ya. [1 ]
Zholudev, M. S. [1 ]
Mikhailov, N. N. [2 ]
Dvoretskii, S. A. [2 ]
Remesnik, V. G. [2 ]
Gavrilenko, V. I. [1 ]
Morozov, S. V. [1 ]
机构
[1] Russian Acad Sci, Inst Phys Microstruct, Nizhnii Novgorod 603087, Russia
[2] Russian Acad Sci, Inst Semicond Phys, Siberian Branch, 13 Lavrentiev Ave, Novosibirsk 630090, Russia
基金
俄罗斯科学基金会;
关键词
STIMULATED-EMISSION; M WAVELENGTH; HOT PHONONS; RECOMBINATION; EDGE; THZ;
D O I
10.1063/5.0130651
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this work, we study stimulated emission (SE) at 3-4 mu m wavelengths from optically pumped bulk HgCdTe and HgTe/CdHgTe quantum-well heterostructures. It is proposed that, under intense excitation of such structures, energy relaxation of hot electrons occurs mostly via electron-hole scattering, while the relaxation of hot holes is direct, phonon-mediated. By balancing carrier generation/recombination and heating/cooling processes, we outline heat-induced limits to the operating temperatures of mid-IR HgCdTe lasers. Based on the existing experimental results for the SE around 3.5 mu m, we predict that lasing at this wavelength may be achieved in 2.5 mu m-pumped optical converters at temperatures as high as T-max similar to 270 K.
引用
收藏
页数:8
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