High-Resolution High-Speed LIBS Microscopy

被引:0
|
作者
Tercier, A. [1 ,2 ]
Vasileva, E. [3 ]
Alvarez-Llamas, C. [1 ]
Fabre, C. [4 ]
Hermelin, S. [1 ]
Soula, B. [5 ]
Trichard, F. [2 ]
Dujardin, C. [1 ]
Motto-Ros, V. [1 ,2 ]
机构
[1] Univ Lyon, UMR 5306, Inst Lumiere Mat, Villeurbanne, France
[2] Ablatom SAS, Villeurbanne, France
[3] Cobolt AB, Stockholm, Sweden
[4] Univ Lorraine, GeoRessources, Vandoeuvre Les Nancy, France
[5] Optoprim, Vanves, France
关键词
D O I
10.56530/spectroscopy.sr2771p7
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Laser-induced breakdown spectroscopy (LIBS) imaging instruments typically utilize lasers with repetition rates below 100 Hz since in most cases this regime provides a good balance of sampling frequency and laser pulse energy. However, measuring large sample areas of a several cm2 with high spatial resolution (<10 μm), at this frequency rate would be very time consuming since millions of spectral data points need to be collected in order to create a high-resolution image (3 h–15 h per cm2). In this work, we explore the approach to reduce, the acquisition time for high resolution LIBS imaging, or so-called μ-LIBS imaging, by using a laser operating in the kHz pulse repetition frequency (PRF) range. As a result, we describe and demonstrate a μ-LIBS imaging microscope which can image >6 cm2 sample areas with about 10 μm resolution in significantly shorter time (<20 min/cm2). The developed system opens a potential for variety of application fields where knowledge of elemental composition and elemental distribution is needed to perform conclusive analysis. © 2023 Advanstar Communications Inc.. All rights reserved.
引用
收藏
页码:34 / 38
页数:5
相关论文
共 50 条
  • [31] High-speed atomic force microscopy: extracting high-resolution information through image analysis
    George R. Heath
    Biophysical Reviews, 2023, 15 : 2065 - 2068
  • [32] A novel A/D converter for high-resolution and high-speed applications
    Ehsanian, M
    BenHamida, N
    Kaminska, B
    ISCAS '97 - PROCEEDINGS OF 1997 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS I - IV: CIRCUITS AND SYSTEMS IN THE INFORMATION AGE, 1997, : 433 - 436
  • [33] A survey of high-speed high-resolution current steering DACs
    Li, Xing
    Zhou, Lei
    JOURNAL OF SEMICONDUCTORS, 2020, 41 (11)
  • [34] A HIGH-SPEED DIGITAL FREQUENCY-SYNTHESIZER WITH HIGH-RESOLUTION
    NAZARENKO, VM
    ILINSKIY, IV
    SHAKHTARIN, BI
    TELECOMMUNICATIONS AND RADIO ENGINEERING, 1982, 36-7 (06) : 97 - 100
  • [35] A HIGH-RESOLUTION, HIGH-SPEED A-D CONVERSION TECHNIQUE
    KEHRER, R
    ISA TRANSACTIONS, 1988, 27 (02) : 51 - 56
  • [36] High-speed high-resolution sample-and-hold circuit
    Yang, Bin
    Yin, Xiumei
    Yang, Huazhong
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 2007, 28 (10): : 1642 - 1646
  • [37] A pipelined A/D converter for high-speed and high-resolution application
    Sun, RH
    Peng, LH
    2002 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL I, PROCEEDINGS, 2002, : 917 - 920
  • [38] High-resolution & high-speed rotary Fourier Transform spectrometer
    Yan, XX
    Zhou, SZ
    Lu, QB
    Bin, XL
    Zhou, RK
    2ND INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, PTS 1 AND 2, 2006, 6150
  • [39] New concept high-speed and high-resolution color scanner
    Nakashima, K
    Shinoda, S
    Konishi, Y
    Sugiyama, K
    Hori, T
    SENSORS AND CAMERA SYSTEMS FOR SCIENTIFIC, INDUSTRIAL, AND DIGITAL PHOTOGRAPHY APPLICATIONS IV, 2003, 5017 : 314 - 322
  • [40] REVERSIBLE HIGH-SPEED HIGH-RESOLUTION IMAGING IN AMORPHOUS SEMICONDUCTORS
    OVSHINSK.SR
    KLOSE, PH
    SID INTERNATIONAL SYMPOSIUM DIGEST OF TECHNICAL PAPERS, 1971, 11 (MAY): : 58 - &