Binocular fringe projection profilometry for the metrology of meter-scale optical surfaces

被引：1

作者：

Berkson, Joel ^{[1
,2
]}

Hyatt, Justin ^{[2
]}

Kang, Hyukmo ^{[1
]}

Ordones, Sotero ^{[1
]}

Quach, Henry ^{[1
]}

Kim, Daewook ^{[1
,2
]}

机构：

[1] Univ Arizona, James C Wyant Coll Opt Sci, 1630 E Univ Blvd, Tucson, AZ 85721 USA

[2] Univ Arizona, Dept Astron & Steward Observ, 933 N Cherry Ave, Tucson, AZ 85721 USA

来源：

OPTICS CONTINUUM | 2023年 / 2卷 / 04期

基金：

美国国家科学基金会;

关键词：

3D SHAPE MEASUREMENT; PHASE; ALGORITHMS; SYSTEM;

D O I：

10.1364/OPTCON.485013

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Demand for better quality, larger quantity, and size of astronomical telescopes from visible to radio frequencies is increasing. More rapid, efficient, and adaptable manufacturing processes are needed to support the needs of growing science and engineering communities in these fields. To aid the development and execution of these new processes, a flexible, accurate, and low-cost metrology system is needed. This paper outlines a variety of fringe projection profilometry (FPP) that has demonstrated high accuracy over large areas, making it a critical tool for manufacturing steel molds for forming primary reflectors and shape verification of the reflectors themselves used for radio astronomy.(c) 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement

引用

页码：697 / 711

页数：15

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