Machine Learning Derived TiO2 Embedded Frequency Selective Surface for EMI Shielding Applications

被引:7
作者
Chaudhary, Varun [1 ]
Panwar, Ravi [2 ,3 ]
机构
[1] Indian Inst Informat Technol Design & Mfg, Discipline Elect & Commun Engn, Jabalpur 482005, Madhya Pradesh, India
[2] Indian Inst Technol BHU Varanasi, Sch Mat Sci & Technol, High Frequency Mat & Struct Lab, Varanasi 221005, India
[3] Indian Inst Informat Technol Design & Mfg, Jabalpur 482005, Madhya Pradesh, India
关键词
shielding; titanium dioxide (TiO2); Deep neural network (DNN); dielectric characterization; frequency selective surface (FSS); ELECTROMAGNETIC-INTERFERENCE; CARBON NANOTUBES; MICROWAVE; DESIGN; COMPOSITES; OXIDE; FSS;
D O I
10.1109/TDEI.2023.3289134
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work intends to offer the design, synthesis, and testing of a polarization-insensitive, angular stable, high shielding effectiveness (SE) nanoparticles embedded frequency selective surface (FSS) structure. Dielectric characterization of the titanium dioxide (TiO2) nanoparticles with different particle sizes is investigated using the waveguide-based microwave measurement setup. SE of 8.4 dB is achieved with a 1.8 mm thick TiO2 layer. Further, an efficient equivalent circuit model (ECM) aided with the deep neural network (DNN) technique is used for material selection, parameter extraction, and understand the physical mechanism of the shielding structure. With the coupling of FSS with TiO2 nanoparticle substrate, the entire X-band is shielded with a minimum SE of 19.52 dB and a mean SE of 26.9 dB. Additionally, angular stability up to 70(degrees) is achieved by cascading a compensation layer, and due to the symmetry of the offered FSS, the designed shielding structure is polarization insensitive. Results obtained from the ECM-backed DNN approach are verified first with full-wave simulation and then by fabrication of the prototype and corresponding measured results at both normal and oblique incidence. Good agreement among all verifies the potential of the aforesaid technique for X-band shielding applications.
引用
收藏
页码:2205 / 2212
页数:8
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