Heterogeneous Cross-Project Defect Prediction Using Encoder Networks and Transfer Learning

被引:0
作者
Haque, Radowanul [1 ]
Ali, Aftab [1 ]
McClean, Sally [1 ]
Cleland, Ian [1 ]
Noppen, Joost [2 ]
机构
[1] Ulster Univ, Sch Comp, Belfast BT15 1ED, North Ireland
[2] Appl Res BT, Ipswich IP5 3RE, Suffolk, England
关键词
Software defect; software engineering; transfer learning;
D O I
10.1109/ACCESS.2023.3343329
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Heterogeneous cross-project defect prediction (HCPDP) aims to predict defects in new software projects using defect data from previous software projects where the source and target projects have some different metrics. Most existing methods only find linear relationships in the software defect datasets. Additionally, these methods use multiple defect datasets from different projects as source datasets. In this paper, we propose a novel method called heterogeneous cross-project defect prediction using encoder networks and transfer learning (ENTL). ENTL uses encoder networks to extract the important features from source and target datasets. Also, to minimize the negative transfer during transfer learning, we used an augmented dataset that contains pseudo-labels and the source dataset. Additionally, we have used a single dataset to train the model. To evaluate the performance of the ENTL approach, 16 datasets from four publicly available software defect projects were used. Furthermore, we compared the proposed method with four HCPDP methods namely EGW, HDP_KS, CTKCCA and EMKCA, and one WPDP method from existing literature. The proposed method on average outperforms the baseline methods in terms of PD, PF, F1-score, G-mean and AUC.
引用
收藏
页码:409 / 419
页数:11
相关论文
共 33 条
[1]   Discriminating features-based cost-sensitive approach for software defect prediction [J].
Ali, Aftab ;
Khan, Naveed ;
Abu-Tair, Mamun ;
Noppen, Joost ;
McClean, Sally ;
McChesney, Ian .
AUTOMATED SOFTWARE ENGINEERING, 2021, 28 (02)
[2]   Contributing Features-Based Schemes for Software Defect Prediction [J].
Ali, Aftab ;
Abu-Tair, Mamun ;
Noppen, Joost ;
McClean, Sally ;
Lin, Zhiwei ;
McChesney, Ian .
ARTIFICIAL INTELLIGENCE XXXVI, 2019, 11927 :350-361
[3]   Assessing the applicability of fault-proneness models across object-oriented software projects [J].
Briand, LC ;
Melo, WL ;
Wüst, J .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2002, 28 (07) :706-720
[4]   A systematic review of software fault prediction studies [J].
Catal, Cagatay ;
Diri, Banu .
EXPERT SYSTEMS WITH APPLICATIONS, 2009, 36 (04) :7346-7354
[5]   Negative samples reduction in cross-company software defects prediction [J].
Chen, Lin ;
Fang, Bin ;
Shang, Zhaowei ;
Tang, Yuanyan .
INFORMATION AND SOFTWARE TECHNOLOGY, 2015, 62 :67-77
[6]   Auto-Encoders in Deep Learning-A Review with New Perspectives [J].
Chen, Shuangshuang ;
Guo, Wei .
MATHEMATICS, 2023, 11 (08)
[7]   Do different cross-project defect prediction methods identify the same defective modules? [J].
Chen, Xiang ;
Mu, Yanzhou ;
Qu, Yubin ;
Ni, Chao ;
Liu, Meng ;
He, Tong ;
Liu, Shangqing .
JOURNAL OF SOFTWARE-EVOLUTION AND PROCESS, 2020, 32 (05)
[8]   A critique of software defect prediction models [J].
Fenton, NE ;
Neil, M .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1999, 25 (05) :675-689
[9]   Reducing the dimensionality of data with neural networks [J].
Hinton, G. E. ;
Salakhutdinov, R. R. .
SCIENCE, 2006, 313 (5786) :504-507
[10]  
Japkowicz N., 2002, Intelligent Data Analysis, V6, P429