Accurate Estimation of Circuit Delay Variance with Limited Monte Carlo Simulations Using Bayesian Inference

被引:0
作者
Chithira, P. R. [1 ]
机构
[1] Natl Inst Technol Calicut, Dept Elect & Commun Engn, Calicut, Kerala, India
来源
2023 24TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, ISQED | 2023年
关键词
Bayesian inference; circuit delay; Monte Carlo simulations; statistical timing analysis; TIMING ANALYSIS;
D O I
10.1109/ISQED57927.2023.10129384
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
An accurate prediction of circuit delay distribution is essential to verify the timing closure of digital circuits and to estimate the parametric yield. In the presence of process variations, the most accurate technique for circuit delay prediction is using Monte Carlo simulations. However, to get an accurate estimate, a large number of Monte Carlo simulations are required which is infeasible in the case of large circuits. Although statistical timing analysis techniques are widely used to predict the circuit delay distribution in a reasonable run time, the standard deviation of circuit delay is often inaccurate. In this work, an efficient technique for circuit delay prediction using limited number of Monte Carlo simulations is proposed. This is done using the concept of Bayesian inference with the results from statistical timing analysis as the prior information. The results indicate that combining statistical timing analysis along with limited number of Monte Carlo simulations increases the accuracy of prediction of circuit delay variance. The number of Monte Carlo simulations can be decided based on the accuracy requirements or run time constraints.
引用
收藏
页码:195 / 200
页数:6
相关论文
共 9 条
[1]   Statistical timing analysis: From basic principles to state of the art [J].
Blaauw, David ;
Chopra, Kaviraj ;
Srivastava, Ashish ;
Scheffer, Lou .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2008, 27 (04) :589-607
[2]   Efficient Parametric Yield Estimation Over Multiple Process Corners via Bayesian Inference Based on Bernoulli Distribution [J].
Gao, Zhengqi ;
Tao, Jun ;
Zhou, Dian ;
Zeng, Xuan .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 39 (10) :3144-3148
[3]   Efficient Rare Failure Analysis Over Multiple Corners via Correlated Bayesian Inference [J].
Gao, Zhengqi ;
Tao, Jun ;
Su, Yangfeng ;
Zhou, Dian ;
Zeng, Xuan ;
Li, Xin .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 39 (10) :2029-2041
[4]   Refined statistical static timing analysis through learning spatial delay correlations [J].
Lee, Benjamin N. ;
Wang, Li-C ;
Abadir, Magdy S. .
43RD DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2006, 2006, :149-+
[5]  
Murphy K.P., 2007, CONJUGATE BAYESIAN A
[6]   First-order incremental block-based statistical timing analysis [J].
Visweswariah, Chandu ;
Ravindran, Kaushik ;
Kalafala, Kerim ;
Walker, Steven G. ;
Narayan, Sambasivan ;
Beece, Daniel K. ;
Piaget, Jeff ;
Venkateswaran, Natesan ;
Hemmett, Jeffrey G. .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2006, 25 (10) :2170-2180
[7]   Simulation-Assisted Formal Verification of Nonlinear Mixed-Signal Circuits With Bayesian Inference Guidance [J].
Yin, Leyi ;
Deng, Yue ;
Li, Peng .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2013, 32 (07) :977-990
[8]   Statistical static timing analysis with conditional linear MAX/MIN approximation and extended canonical timing model [J].
Zhang, Lizheng ;
Chen, Weijen ;
Hu, Yuhen ;
Chen, Charlie Chung-Ping .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2006, 25 (06) :1183-1191
[9]  
Zhaobo Zhang, 2010, 2010 28th VLSI Test Symposium (VTS 2010), P244, DOI 10.1109/VTS.2010.5469569