Local-enhanced transformer for single-pixel imaging

被引:11
作者
Tian, Ye [1 ,2 ]
Fu, Ying [3 ,4 ]
Zhang, Jun [1 ,2 ,4 ]
机构
[1] Beijing Inst Technol, Sch Informat & Elect, Beijing 100081, Peoples R China
[2] Beijing Inst Technol, Adv Res Inst Multidisciplinary Sci, Beijing 100081, Peoples R China
[3] Beijing Inst Technol, Sch Comp Sci & Technol, Beijing 100081, Peoples R China
[4] Yangtze Delta Reg Acad Beijing Inst Technol, Jiaxing 314019, Peoples R China
基金
中国国家自然科学基金;
关键词
Learning systems - Pixels;
D O I
10.1364/OL.483877
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Deep learning networks have been applied to under-sampled single-pixel imaging (SPI) for better reconstruction per-formance. However, the existing deep-learning-based SPI methods with convolutional filters have difficulty in mod-eling long-range dependencies of SPI measurements and thus show limited reconstruction quality. Recently, the transformer has demonstrated great potential in capturing long-range dependencies, but it lacks locality mechanism and thus could be sub-optimal when directly used for under -sampled SPI. In this Letter, we propose a high-quality under-sampled SPI method based on a novel, to the best of our knowledge, local-enhanced transformer. The proposed local-enhanced transformer is not only good at capturing global dependencies of SPI measurements, but also has the capability to model local dependencies. Additionally, the proposed method employs optimal binary patterns, which makes the sampling high-efficiency and hardware-friendly. Experiments on simulated data and real measured data demonstrate that our proposed method outperforms the state-of-the-art SPI methods. (c) 2023 Optica Publishing Group
引用
收藏
页码:2635 / 2638
页数:4
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