Bridge percolation: electrical connectivity of discontinued conducting slabs by metallic nanowires

被引:4
作者
Baret, A. [1 ]
Bardet, L. [2 ]
Oser, D. [2 ]
Langley, D. P. [3 ,4 ]
Balty, F. [1 ]
Bellet, D. [2 ]
Nguyen, N. D. [1 ]
机构
[1] Univ Liege, Dept Phys, SPIN, Allee Six Aout 19, B-4000 Liege, Belgium
[2] Univ Grenoble Alpes, CNRS, Grenoble INP, LMGP, F-38016 Grenoble, France
[3] Deakin Univ, Inst Frontier Mat, Burwood, Vic, Australia
[4] Quantum Brilliance Pty Ltd, Haymarket, NSW, Australia
关键词
TRANSPARENT ELECTRODES; SPANNING PROBABILITY; THIN-FILMS; OXIDE; PERFORMANCE; RESISTANCE; NETWORKS;
D O I
10.1039/d3nr05850f
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The properties of nanostructured networks of conductive materials have been extensively studied under the lens of percolation theory. In this work, we introduce a novel type of local percolation phenomenon used to investigate the conduction properties of a new hybrid material that combines sparse metallic nanowire networks and fractured conducting thin films on flexible substrates. This original concept could potentially lead to the design of a novel composite transparent conducting material. Using a complementary approach including formal analytical derivations, Monte Carlo simulations and electrical circuit representation for the modelling of bridged-percolating nanowire networks, we unveil the key relations between linear crack density, nanowire length and network areal mass density that ensure electrical percolation through the hybrid. The proposed theoretical model provides key insights into the conduction mechanism associated with the original concept of bridge percolation in random nanowire networks. A novel composite material is introduced and its unique electrical conduction properties are investigated using the original concept of bridge percolation. The study provides key insights into its percolation and resistive scaling behaviors.
引用
收藏
页码:8361 / 8368
页数:9
相关论文
共 56 条
[1]   Versatility of bilayer metal oxide coatings on silver nanowire networks for enhanced stability with minimal transparency loss [J].
Aghazadehchors, Sara ;
Viet Huong Nguyen ;
Munoz-Rojas, David ;
Jimenez, Carmen ;
Rapenne, Laetitia ;
Ngoc Duy Nguyen ;
Bellet, Daniel .
NANOSCALE, 2019, 11 (42) :19969-19979
[2]   Invariant percolation properties in some continuum systems [J].
Alvarez-Alvarez, A. ;
Balberg, I ;
Fernandez-Alvarez, J. P. .
PHYSICAL REVIEW B, 2021, 104 (18)
[3]   EXCLUDED VOLUME AND ITS RELATION TO THE ONSET OF PERCOLATION [J].
BALBERG, I ;
ANDERSON, CH ;
ALEXANDER, S ;
WAGNER, N .
PHYSICAL REVIEW B, 1984, 30 (07) :3933-3943
[4]   The physical fundamentals of the electrical conductivity in nanotube-based composites [J].
Balberg, Isaac .
JOURNAL OF APPLIED PHYSICS, 2020, 128 (20)
[5]   Computational study of geometry-dependent resistivity scaling in single-walled carbon nanotube films [J].
Behnam, Ashkan ;
Ural, Ant .
PHYSICAL REVIEW B, 2007, 75 (12)
[6]   Resistance of Single Ag Nanowire Junctions and Their Role in the Conductivity of Nanowire Networks [J].
Bellew, Allen T. ;
Manning, Hugh G. ;
da Rocha, Claudia Gomes ;
Ferreira, Mauro S. ;
Boland, John J. .
ACS NANO, 2015, 9 (11) :11422-11429
[7]   Effective resistance of random percolating networks of stick nanowires: Functional dependence on elementary physical parameters [J].
Benda, Robert ;
Cances, Eric ;
Lebental, Berengere .
JOURNAL OF APPLIED PHYSICS, 2019, 126 (04)
[8]   Transparent conductive single-walled carbon nanotube networks with precisely tunable ratios of semiconducting and metallic nanotubes [J].
Blackburn, Jeffrey L. ;
Barnes, Teresa M. ;
Beard, Matthew C. ;
Kim, Yong-Hyun ;
Tenent, Robert C. ;
McDonald, Timothy J. ;
To, Bobby ;
Coutts, Timothy J. ;
Heben, Michael J. .
ACS NANO, 2008, 2 (06) :1266-1274
[9]   Strain-dependent electrical resistance of tin-doped indium oxide on polymer substrates [J].
Cairns, DR ;
Witte, RP ;
Sparacin, DK ;
Sachsman, SM ;
Paine, DC ;
Crawford, GP ;
Newton, RR .
APPLIED PHYSICS LETTERS, 2000, 76 (11) :1425-1427
[10]   An evaluation of the MPM for simulating dynamic failure with damage diffusion [J].
Chen, Z ;
Hu, W ;
Shen, L ;
Xin, X ;
Brannon, R .
ENGINEERING FRACTURE MECHANICS, 2002, 69 (17) :1873-1890