Orientation and size effects on phonon thermal conductivity in silicon/germanium multilayer structures

被引:1
作者
Khamets, Alexander L. [1 ]
Khaliava, Ivan I. [1 ]
Safronov, Igor V. [2 ]
Filonov, Andrew B. [1 ]
Migas, Dmitri B. [1 ,3 ]
机构
[1] Belarusian State Univ Informat & Radioelect, Minsk 220089, BELARUS
[2] Belarusian State Univ, Minsk 220030, BELARUS
[3] Natl Res Nucl Univ MEPhI, Moscow Engn Phys Inst, Kashirskoe Shosse 31, Moscow 115409, Russia
关键词
phonon thermal conductivity; non-equilibrium molecular dynamics; Si/Ge multilayer films; phonon scattering; thermoelectric materials; SILICON; BULK;
D O I
10.35848/1347-4065/acad0c
中图分类号
O59 [应用物理学];
学科分类号
摘要
We study the effect of morphology on the in-and cross-plane phonon thermal conductivity of the (001), (110), and (111) oriented Si/Ge multilayer films by means of non-equilibrium molecular dynamics at 300 K. The extended comparison of the estimated values for the multilayer films to one for the appropriate homogeneous Si and Ge films has been performed. The results revealed a significant advantage in reducing the thermal conductivity of the Si/Ge multilayer films compared to the referenced homogeneous Ge and Si films for the cross-plane transport regardless of the film orientation, and for the in-plane transport only for (001)/[(sic)10], (110)/[001] directions with an increase in the number of periods, which indicated the prospects of such layered structures.(c) 2023 The Japan Society of Applied Physics
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页数:10
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