A Systematic Survey of Just-in-Time Software Defect Prediction

被引:32
|
作者
Zhao, Yunhua [1 ]
Damevski, Kostadin [2 ]
Chen, Hui [1 ,3 ]
机构
[1] CUNY, Grad Ctr, Dept Comp Sci, 365 5th Ave, New York, NY 10016 USA
[2] Virginia Commonwealth Univ, Dept Comp Sci, 401 West Main St, Richmond, VA 23284 USA
[3] CUNY, Brooklyn Coll, Dept Comp & Informat Sci, 2900 Bedford Ave, Brooklyn, NY 11210 USA
关键词
Software defect prediction; release software defect prediction; just-in-time software defect prediction; change-level software defect prediction; machine learning; searching-based algorithms; software change metrics; change defect density; REVIEWS; MODELS; IMPACT;
D O I
10.1145/3567550
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Recent years have experienced sustained focus in research on software defect prediction that aims to predict the likelihood of software defects. Moreover, with the increased interest in continuous deployment, a variant of software defect prediction called Just-in-Time Software Defect Prediction ( JIT-SDP) focuses on predicting whether each incremental software change is defective. JIT-SDP is unique in that it consists of two interconnected data streams, one consisting of the arrivals of software changes stemming from design and implementation, and the other the (defective or clean) labels of software changes resulting from quality assurance processes. We present a systematic survey of 67 JIT-SDP studies with the objective to help researchers advance the state of the art in JIT-SDP and to help practitioners become familiar with recent progress. We summarize best practices in each phase of the JIT-SDP workflow, carry out a meta-analysis of prior studies, and suggest future research directions. Our meta-analysis of JIT-SDP studies indicates, among other findings, that the predictive performance correlates with change defect ratio, suggesting that JIT-SDP is most performant in projects that experience relatively high defect ratios. Future research directions for JIT-SDP include situating each technique into its application domain, reliability-aware JIT-SDP, and user-centered JIT-SDP.
引用
收藏
页数:35
相关论文
共 50 条
  • [41] Survey of software defect prediction features
    Shaoming Qiu
    Bicong E
    Jingjie He
    Liangyu Liu
    Neural Computing and Applications, 2025, 37 (4) : 2113 - 2144
  • [42] Empirical Study of Software Defect Prediction: A Systematic Mapping
    Le Hoang Son
    Pritam, Nakul
    Khari, Manju
    Kumar, Raghvendra
    Pham Thi Minh Phuong
    Pham Huy Thong
    SYMMETRY-BASEL, 2019, 11 (02):
  • [43] Survey of Open-Source Software Defect Prediction Method
    Tian X.
    Chang J.
    Zhang C.
    Rong J.
    Wang Z.
    Zhang G.
    Wang H.
    Wu G.
    Hu J.
    Zhang Y.
    Jisuanji Yanjiu yu Fazhan/Computer Research and Development, 2023, 60 (07): : 1467 - 1488
  • [44] Cognitive Inherent SLR Enabled Survey for Software Defect Prediction
    Mishra A.
    Sharma A.
    Recent Advances in Computer Science and Communications, 2024, 17 (05) : 1 - 11
  • [45] Ensemble Classifiers in Software Defect Prediction: A Systematic Literature Review
    Olivares-Galindo, Johann A.
    Sanchez-Garcia, Angel J.
    Barrientos-Martinez, R. Erandi
    Ocharan-Hernandez, Jorge Octavio
    2023 11TH INTERNATIONAL CONFERENCE IN SOFTWARE ENGINEERING RESEARCH AND INNOVATION, CONISOFT 2023, 2023, : 1 - 8
  • [46] A Survey on Software Defect Prediction in Cross Project
    Jadhav, Rohini
    Joshi, Shashank. D.
    Thorat, Umesh
    Joshi, Aditi S.
    PROCEEDINGS OF THE 2019 6TH INTERNATIONAL CONFERENCE ON COMPUTING FOR SUSTAINABLE GLOBAL DEVELOPMENT (INDIACOM), 2019, : 1014 - 1019
  • [47] A systematic review of unsupervised learning techniques for software defect prediction
    Li, Ning
    Shepperd, Martin
    Guo, Yuchen
    INFORMATION AND SOFTWARE TECHNOLOGY, 2020, 122 (122)
  • [48] Cross-Project setting using Deep learning Architectures in Just-In-Time Software Fault Prediction: An Investigation
    Pandey, Sushant Kumar
    Tripathi, Anil Kumar
    2023 IEEE/ACM INTERNATIONAL CONFERENCE ON AUTOMATION OF SOFTWARE TEST, AST, 2023, : 24 - 34
  • [49] Temporal convolutional networks for just-in-time design smells prediction using fine-grained software metrics
    Ardimento, Pasquale
    Aversano, Lerina
    Bernardi, Mario Luca
    Cimitile, Marta
    Iammarino, Martina
    NEUROCOMPUTING, 2021, 463 : 454 - 471
  • [50] Integrated Approach to Software Defect Prediction
    Felix, Ebubeogu Amarachukwu
    Lee, Sai Peck
    IEEE ACCESS, 2017, 5 : 21524 - 21547