Bulk single crystals and physical properties of β-(AlxGa1-x)2O3 (x=0-0.35) grown by the Czochralski method

被引:20
作者
Galazka, Zbigniew [1 ]
Fiedler, Andreas [1 ]
Popp, Andreas [1 ]
Ganschow, Steffen [1 ]
Kwasniewski, Albert [1 ]
Seyidov, Palvan [1 ]
Pietsch, Mike [1 ]
Dittmar, Andrea [1 ]
Anooz, Saud Bin [1 ]
Irmscher, Klaus [1 ]
Suendermann, Manuela [1 ]
Klimm, Detlef [1 ]
Chou, Ta-Shun [1 ]
Rehm, Jana [1 ]
Schroeder, Thomas [1 ,2 ]
Bickermann, Matthias [1 ,3 ]
机构
[1] Leibniz Inst Kristallzuchtung, Max Born Str 2, D-12489 Berlin, Germany
[2] Humboldt Univ, Inst Phys, Newtonstr 15, D-12489 Berlin, Germany
[3] Tech Univ Berlin, Inst Chem, Str 17 Juni 115, D-10623 Berlin, Germany
关键词
BETA-GA2O3; PROGRESS;
D O I
10.1063/5.0131285
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have systematically studied the growth, by the Czochralski method, and basic physical properties of a 2 cm and 2 in. diameter bulk beta-(AlxGa1-x)(2)O-3 single crystal with [Al] = 0-35 mol. % in the melt in 5 mol. % steps. The segregation coefficient of Al in the Ga2O3 melt of 1.1-1.2 results in a higher Al content in the crystals than in the melt. The crystals were also co-doped with Si or Mg. [Al] = 30 mol. % in the melt (33-36 mol. % in the crystals) seems to be a limit for obtaining bulk single crystals of high structural quality suitable for homoepitaxy. The crystals were either semiconducting (no intentional co-dopants with [Al] = 0-30 mol. % and Si-doped with [Al] = 15-20 mol. %), degenerately semiconducting (Si-doped with [Al] <= 15 mol. %), or semi-insulating ([Al] >= 25 mol. % and/or Mg-doped). The full width at half maximum of the rocking curve was 30-50 arcsec. The crystals showed a linear but anisotropic decrease in all lattice constants and a linear increase in the optical bandgap (5.6 eV for [Al] = 30 mol. %). The room temperature electron mobility at similar free electron concentrations gradually decreases with [Al], presumably due to enhanced scattering at phonons as the result of a larger lattice distortion. In Si co-doped crystals, the scattering is enhanced by ionized impurities. Measured electron mobilities and bandgaps enabled to estimate the Baliga figure of merit for electronic devices.
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页数:11
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