A thermally optimizing method of thin film resistor trimming with machine learning

被引:1
作者
Arima, Taisei [1 ]
Hidaka, Shigeru [2 ]
Watanabe, Ryosuke [1 ]
Akasaka, Tomoya [1 ]
Kurokawa, Atsushi [1 ]
Kanamoto, Toshiki [1 ]
机构
[1] Hirosaki Univ, Hirosaki, Aomori 0368560, Japan
[2] Nikkohm Co Ltd, Misawa, Aomori 0330036, Japan
来源
IEICE ELECTRONICS EXPRESS | 2023年 / 20卷 / 05期
关键词
thermal; thin film resistor; trimming; machine learning; TCR CONTROL;
D O I
10.1587/elex.20.20230014
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes a novel trimming method of thin-film re-sistors dedicated to the power modules. Thin-film resistors are utilized for applications including snubber circuits which avoids unwanted ringing appearing in the output voltage of power transistors. Our previous works have revealed that the applicable voltage of a NiCr thin-film resistor is thermally limited, and then the indispensable trimming process affects the degree of temperature rise in use. In this paper, we first formulate the rela-tionship between the target resistance value and the trim dimensions using machine learning. With the obtained equation, we propose a new trimming method, which enables the trimmed pattern to reduce the variability of the maximum temperature rise. The experimental results show that the pro-posed trimming method can suppress the estimated range of the maximum temperature from 619 K to 179 K.
引用
收藏
页码:1 / 6
页数:6
相关论文
共 41 条
  • [1] Alafogianni M, 2016, 2016 INTERNATIONAL CONFERENCE FOR STUDENTS ON APPLIED ENGINEERING (ICSAE), P79, DOI 10.1109/ICSAE.2016.7810165
  • [2] [Anonymous], 2022, LTSPICE 17
  • [3] [Anonymous], MICROSOFT
  • [4] [Anonymous], FEMTET 2018 1 2
  • [5] Laser Trim Pattern Optimization for CuAlMo Thin-Film Resistors
    Birkett, Martin
    Penlington, Roger
    [J]. IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2013, 3 (03): : 523 - 529
  • [6] Laser Trimming of CuAlMo Thin-Film Resistors: Effect of Laser Processing Parameters
    Birkett, Martin
    Penlington, Roger
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2012, 41 (08) : 2169 - 2177
  • [7] Laser-Induced Resistance Fine Tuning of Integrated Polysilicon Thin-Film Resistors
    Boulais, Etienne
    Fantoni, Julie
    Chateauneuf, Alexandre
    Savaria, Yvon
    Meunier, Michel
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2011, 58 (02) : 572 - 575
  • [8] STABILITY ANALYSIS OF LASER TRIMMED THIN-FILM RESISTORS
    BULGER, GA
    [J]. IEEE TRANSACTIONS ON PARTS HYBRIDS AND PACKAGING, 1975, 11 (03): : 172 - 177
  • [9] Chang HR, 2014, INT INTEG REL WRKSP, p165B
  • [10] Chiang CS, 2014, INT SYMP NEXTGEN