Three-phase material mapping with incomplete X-ray diffraction spectral information

被引:0
作者
Chang, Xuyang [1 ]
Lavernhe-Taillard, Karine [1 ]
Roux, Stephane [1 ]
Hubert, Olivier [1 ]
机构
[1] Univ Paris Saclay, LMPS Lab Mecan Paris Saclay, Cent Supelec, ENS Paris Saclay,CNRS, F-91190 Gif Sur Yvette, France
关键词
X-ray diffraction; shape-memory alloys; proper orthogonal decomposition; PREFERRED ORIENTATION; PHASE-TRANSFORMATION; POWDER DIFFRACTOMETRY; MARCH;
D O I
10.1107/S160057672300331X
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
An equiatomic nickel-titanium shape-memory alloy specimen subjected to a uniaxial tensile load undergoes a two-step phase transformation under stress, from austenite (A) to a rhombohedral phase (R) and further to martensite (M) variants. The pseudo-elasticity that goes accompanies the phase transformation induces spatial inhomogeneity. To unravel the spatial distribution of the phases, in situ X-ray diffraction analyses are performed while the sample is under tensile load. However, the diffraction spectra of the R phase, as well as the extent of potential martensite detwinning, are not known. A novel algorithm, based on a proper orthogonal decomposition and incorporating inequality constraints, is proposed in order to map out the different phases and simultaneously yield the missing diffraction spectral information. An experimental case study illustrates the methodology.
引用
收藏
页码:750 / 763
页数:14
相关论文
共 22 条
[1]  
ANSCOMBE FJ, 1948, BIOMETRIKA, V35, P246, DOI 10.1093/biomet/35.3-4.246
[2]  
BHATTACHARYA K, 2003, OXFORD SERIES MAT MO
[3]  
Boyd S., 2003, Notes on Decomposition Methods. Online at
[4]   Stochastic multiscale modeling of the thermomechanical behavior of polycrystalline shape memory alloys [J].
Chang, Xuyang ;
Lavernhe-Taillard, Karine ;
Hubert, Olivier .
MECHANICS OF MATERIALS, 2020, 144
[5]  
Chatterjee A, 2000, CURR SCI INDIA, V78, P808
[6]  
Cullity B.D., 1956, ELEMENTS XRAY DIFFRA
[7]   SIGNIFICANCE OF TEXTURE PARAMETERS IN PHASE ANALYSIS BY X-RAY DIFFRACTION [J].
DICKSON, MJ .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 :176-&
[8]   CORRECTION OF INTENSITIES FOR PREFERRED ORIENTATION IN POWDER DIFFRACTOMETRY - APPLICATION OF THE MARCH MODEL [J].
DOLLASE, WA .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 (pt 4) :267-272
[9]  
DRICKAMER HG, 1966, SOLID STATE PHYS, V19, P135
[10]   Strain field in silicon on insulator lines using high resolution x-ray diffraction [J].
Gailhanou, M. ;
Loubens, A. ;
Micha, J. -S. ;
Charlet, B. ;
Minkevich, A. A. ;
Fortunier, R. ;
Thomas, O. .
APPLIED PHYSICS LETTERS, 2007, 90 (11)