Real-Time Open-Circuit Fault Diagnosis Method for T-Type Rectifiers Based on Median Current Analysis

被引:8
作者
Wu, Zhixi [1 ]
Zhao, Jin [1 ]
Luo, Hui [1 ]
Liu, Yang [1 ]
机构
[1] Huazhong Univ Sci & Technol, Sch Artificial Intelligence & Automat, Key Lab Imaging Proc & Intelligence Control, Wuhan 430074, Peoples R China
基金
中国国家自然科学基金;
关键词
Change point detection; fault frequency modulation; median current; open-circuit fault diagnosis; T-type rectifier; OPEN-SWITCH FAULT; BACK CONVERTERS; VOLTAGE VECTOR;
D O I
10.1109/TPEL.2023.3265188
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
T-type rectifiers are widely used in dc fast chargers, super uninterrupted power supplies, renewable energy, and other low- and medium-voltage rectifier applications. These applications often require high equipment reliability and high-quality power but are damaged by the transistor open-circuit fault. This article proposes a novel real-time open-circuit fault diagnosis method for the T-type rectifier based on median current analysis. The method only uses the three-phase currents to obtain the median current and realize the diagnosis. In the rectifier, partial open-circuit faults result in weak fault signals, making the diagnosis challenging. To solve this, the median current obtained by the currents performs fault frequency modulation to enhance the fault signals at first. Then, the ratio of the fundamental frequency to the dc component is used to realize fault detection. The inner/outer fault is identified at the same time. At last, the fault transistor is located by simple change point detection. The change points determine the fault phase and transistor fault. The effectiveness and robustness of the proposed method are verified by the experiment results.
引用
收藏
页码:8956 / 8965
页数:10
相关论文
共 34 条
[1]   Fault Detection Methods for Three-Level NPC Inverter Based on DC-Bus Electromagnetic Signatures [J].
Abari, Ibtissem ;
Lahouar, Ali ;
Hamouda, Mahmoud ;
Slama, Jaleleddine Ben Hadj ;
Al-Haddad, Kamal .
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2018, 65 (07) :5224-5236
[2]   Real-Time IGBT Open-Circuit Fault Diagnosis in Three-Level Neutral-Point-Clamped Voltage-Source Rectifiers Based on Instant Voltage Error [J].
Caseiro, Luis M. A. ;
Mendes, Andre M. S. .
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2015, 62 (03) :1669-1678
[3]   Open-Circuit Fault Diagnosis Method in NPC Rectifiers Using Fault-Assumed Strategy [J].
Chen, Mingyun ;
He, Yigang .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2022, 37 (11) :13668-13683
[4]   Multiple Open-Circuit Fault Diagnosis Method in NPC Rectifiers Using Fault Injection Strategy [J].
Chen, Mingyun ;
He, Yigang .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2022, 37 (07) :8554-8571
[5]   Open-Circuit Fault Diagnosis and Fault-Tolerant Control for a Grid-Connected NPC Inverter [J].
Choi, Ui-Min ;
Lee, June-Seok ;
Blaabjerg, Frede ;
Lee, Kyo-Beum .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2016, 31 (10) :7234-7247
[6]   Diagnosis and Tolerant Strategy of an Open-Switch Fault for T-Type Three-Level Inverter Systems [J].
Choi, Ui-Min ;
Lee, Kyo-Beum ;
Blaabjerg, Frede .
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2014, 50 (01) :495-508
[7]   Method for Detecting an Open-Switch Fault in a Grid-Connected NPC Inverter System [J].
Choi, Ui-Min ;
Jeong, Hae-Gwang ;
Lee, Kyo-Beum ;
Blaabjerg, Frede .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2012, 27 (06) :2726-2739
[8]   Full Digital Control and Multi-Loop Tuning of a Three-Level T-Type Rectifier for Electric Vehicle Ultra-Fast Battery Chargers [J].
Cittanti, Davide ;
Gregorio, Matteo ;
Bossotto, Eugenio ;
Mandrile, Fabio ;
Bojoi, Radu .
ELECTRONICS, 2021, 10 (12)
[9]   Reliability of Power Electronics Systems [J].
Falck, Johannes ;
Felgemacher, Christian ;
Rojko, Andreja ;
Liserre, Marco ;
Zacharias, Peter .
IEEE INDUSTRIAL ELECTRONICS MAGAZINE, 2018, 12 (02) :24-35
[10]   Multilevel Inverter Topologies With Reduced Device Count: A Review [J].
Gupta, Krishna Kumar ;
Ranjan, Alekh ;
Bhatnagar, Pallavee ;
Sahu, Lalit Kumar ;
Jain, Shailendra .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2016, 31 (01) :135-151