共 9 条
- [1] [Anonymous], CPW61200Z050A
- [2] Multilayer film passivation for enhanced reliability of power semiconductor devices [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2020, 38 (02):
- [3] Koelmans H., 1974, 12 IRPS, P168
- [4] Konstantinov A, 2015, P PCIM EUROPE 2015, P1
- [5] Static Performance and Reliability of 4H-SiC Diodes with P plus Regions Formed by Various Profiles and Temperatures [J]. 2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2022,
- [7] Peck D. S., 1986, 24th Annual Proceedings Reliability Physics 1986 (Cat. No.86CH2256-6), P44, DOI 10.1109/IRPS.1986.362110
- [8] Zorn Christian, 2018, Materials Science Forum, V924, P581, DOI 10.4028/www.scientific.net/MSF.924.581