An active learning method based on result quality evaluation for printed circuit board computed tomography image segmentation

被引:0
作者
Song, Baojie [1 ]
Qiao, Kai [1 ]
Yang, Jie [1 ]
Shi, Shuhao [1 ]
Chen, Jian [1 ]
Yan, Bin [1 ]
机构
[1] Peoples Liberat Army PLA Strateg Support Force Inf, Henan Key Lab Imaging & Intelligent Proc, Zhengzhou 450001, Henan, Peoples R China
关键词
computer vision; image segmentation; inverse problems; non-destructive testing;
D O I
10.1049/ipr2.12888
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Element detection is a key step in non-destructive testing of printed circuit board (PCB) based on computed tomography (CT). In recent years, some image segmentation methods based on deep learning have shown great potential in the element segmentation task of PCB CT images, and greatly improved the efficiency and accuracy. However, since image segmentation is based on pixel-level classification, the annotation of training data is difficult and costly. Aiming at this problem, the authors proposed a new active learning method based on the integration of relevant information about segmentation tasks and data variance. In this method, the Result Quality Evaluation Module (RQEM) proposed by us is used to generate task-related information, and an adversarial network is used to generate the difference information between samples and the initial labelled data. Finally, the two parts of information are fused and used as the standard of data selecting. In the PCB CT image element segmentation task, the authors only need to select 12.7% of the whole training set with their proposed method to make Mean Intersection Over Union (MIOU) reach 79.7, which has reached 95% of the optimal performance of 83.7. The in-depth analysis also verifies the effectiveness and stability of the authors' method.
引用
收藏
页码:3688 / 3701
页数:14
相关论文
共 51 条
[1]   PCB Reverse Engineering Using Nondestructive X-ray Tomography and Advanced Image Processing [J].
Asadizanjani, Navid ;
Tehranipoor, Mark ;
Forte, Domenic .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2017, 7 (02) :292-299
[2]  
Asadizanjani N, 2015, ISTFA 2015: CONFERENCE PROCEEDINGS FROM THE 41ST INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, P164
[3]   SegNet: A Deep Convolutional Encoder-Decoder Architecture for Image Segmentation [J].
Badrinarayanan, Vijay ;
Kendall, Alex ;
Cipolla, Roberto .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2017, 39 (12) :2481-2495
[4]  
Borsos Zalan, 2020, Advances in neural information processing systems, V33, P14879
[5]  
Botero U.J., 2020, P 46 INT S TESTING F, P157
[6]  
Botero U. J., 2020, P ANN GOMACTECH C
[7]  
Chen LC., 2017, RETHINKING ATROUS CO
[8]   Encoder-Decoder with Atrous Separable Convolution for Semantic Image Segmentation [J].
Chen, Liang-Chieh ;
Zhu, Yukun ;
Papandreou, George ;
Schroff, Florian ;
Adam, Hartwig .
COMPUTER VISION - ECCV 2018, PT VII, 2018, 11211 :833-851
[9]   DeepLab: Semantic Image Segmentation with Deep Convolutional Nets, Atrous Convolution, and Fully Connected CRFs [J].
Chen, Liang-Chieh ;
Papandreou, George ;
Kokkinos, Iasonas ;
Murphy, Kevin ;
Yuille, Alan L. .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2018, 40 (04) :834-848
[10]   VaB-AL: Incorporating Class Imbalance and Difficulty with Variational Bayes for Active Learning [J].
Choi, Jongwon ;
Yi, Kwang Moo ;
Kim, Jihoon ;
Choo, Jinho ;
Kim, Byoungjip ;
Chang, Jinyeop ;
Gwon, Youngjune ;
Chang, Hyung Jin .
2021 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, CVPR 2021, 2021, :6745-6754