Draft Genome Sequence of a Xylella fastidiosa Strain Causing Bacterial Leaf Scorch of American Elm in Washington, DC

被引：1

作者：

Guan, Wei ^{[1
,3
]}

Shao, Jonathan ^{[2
]}

Zhao, Tingchang ^{[3
]}

Huang, Qi ^{[1
]}

机构：

[1] US Dept Agr, Agr Res Serv, US Natl Arboretum, Floral & Nursery Plants Res Unit, Beltsville, MD 20705 USA

[2] US Dept Agr, Agr Res Serv, North East Area, Beltsville, MD USA

[3] Chinese Acad Agr Sci, Inst Plant Protect, State Key Lab Biol Plant Dis & Insect Pests, Beijing, Peoples R China

来源：

MICROBIOLOGY RESOURCE ANNOUNCEMENTS | 2023年 / 12卷 / 01期

关键词：

TRANSFER-RNA GENES;

D O I：

10.1128/mra.00831-22

中图分类号：

Q93 [微生物学];

学科分类号：

071005 ; 100705 ;

摘要：

Here, we report the draft genome sequence of Xylella fastidiosa strain ATCC 35873, which was obtained from the American Type Culture Collection and was originally isolated from a symptomatic American elm tree grown in Washington, DC. The ATCC 35873 genome contains 2,454,216 bp and has a GC content of 51.68%. Here, we report the draft genome sequence of Xylella fastidiosa strain ATCC 35873, which was obtained from the American Type Culture Collection and was originally isolated from a symptomatic American elm tree grown in Washington, DC. The ATCC 35873 genome contains 2,454,216 bp and has a GC content of 51.68%.

引用

页数：2