Attention-based long short-term memory fully convolutional network for chemical process fault diagnosis

被引:24
作者
Xiong, Shanwei [1 ]
Zhou, Li [1 ]
Dai, Yiyang [1 ]
Ji, Xu [1 ]
机构
[1] Sichuan Univ, Sch Chem Engn, Chengdu 610065, Peoples R China
来源
CHINESE JOURNAL OF CHEMICAL ENGINEERING | 2023年 / 56卷
关键词
Safety; Fault diagnosis; Process systems; Long short -term memory; Attention mechanism; Neural networks; NEURAL-NETWORKS; RECOGNITION;
D O I
10.1016/j.cjche.2022.06.029
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
A correct and timely fault diagnosis is important for improving the safety and reliability of chemical pro-cesses. With the advancement of big data technology, data-driven fault diagnosis methods are being extensively used and still have considerable potential. In recent years, methods based on deep neural net-works have made significant breakthroughs, and fault diagnosis methods for industrial processes based on deep learning have attracted considerable research attention. Therefore, we propose a fusion deep-learning algorithm based on a fully convolutional neural network (FCN) to extract features and build models to correctly diagnose all types of faults. We use long short-term memory (LSTM) units to expand our proposed FCN so that our proposed deep learning model can better extract the time-domain features of chemical process data. We also introduce the attention mechanism into the model, aimed at highlight-ing the importance of features, which is significant for the fault diagnosis of chemical processes with many features. When applied to the benchmark Tennessee Eastman process, our proposed model exhibits impressive performance, demonstrating the effectiveness of the attention-based LSTM FCN in chemical process fault diagnosis.(c) 2022 The Chemical Industry and Engineering Society of China, and Chemical Industry Press Co., Ltd. All rights reserved.
引用
收藏
页码:1 / 14
页数:14
相关论文
共 39 条
[1]   A Bibliometric Review and Analysis of Data-Driven Fault Detection and Diagnosis Methods for Process Systems [J].
Alauddin, Md ;
Khan, Faisal ;
Imtiaz, Syed ;
Ahmed, Salim .
INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH, 2018, 57 (32) :10719-10735
[2]  
[Anonymous], 2015, CVPR
[3]  
[Anonymous], 2011, P 14 INT C ARTIFICIA
[4]   Bidirectional deep recurrent neural networks for process fault classification [J].
Chadha, Gavneet Singh ;
Panambilly, Ambarish ;
Schwung, Andreas ;
Ding, Steven X. .
ISA TRANSACTIONS, 2020, 106 :330-342
[5]   A Novel Channel and Temporal-Wise Attention in Convolutional Networks for Multivariate Time Series Classification [J].
Cheng, Xu ;
Han, Peihua ;
Li, Guoyuan ;
Chen, Shengyong ;
Zhang, Houxiang .
IEEE ACCESS, 2020, 8 :212247-212257
[6]   Long-Term Recurrent Convolutional Networks for Visual Recognition and Description [J].
Donahue, Jeff ;
Hendricks, Lisa Anne ;
Rohrbach, Marcus ;
Venugopalan, Subhashini ;
Guadarrama, Sergio ;
Saenko, Kate ;
Darrell, Trevor .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2017, 39 (04) :677-691
[7]   A PLANT-WIDE INDUSTRIAL-PROCESS CONTROL PROBLEM [J].
DOWNS, JJ ;
VOGEL, EF .
COMPUTERS & CHEMICAL ENGINEERING, 1993, 17 (03) :245-255
[8]   Data-Driven Prescriptive Maintenance: Failure Prediction Using Ensemble Support Vector Classification for Optimal Process and Maintenance Scheduling [J].
Gordon, Christopher Ampofo Kwadwo ;
Burnak, Baris ;
Onel, Melis ;
Pistikopoulos, Efstratios N. .
INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH, 2020, 59 (44) :19607-19622
[9]  
Graves A, 2013, INT CONF ACOUST SPEE, P6645, DOI 10.1109/ICASSP.2013.6638947
[10]  
Han YM, 2018, INT C PATT RECOG, P284, DOI 10.1109/ICPR.2018.8545558