Nucleation and growth of Ag3Sn in Sn-Ag and Sn-Ag-Cu solder alloys

被引:43
作者
Cui, Y. [1 ]
Xian, J. W. [1 ]
Zois, A. [1 ]
Marquardt, K. [1 ]
Yasuda, H. [2 ]
Gourlay, C. M. [1 ]
机构
[1] Imperial Coll London, Dept Mat, London SW7 2AZ, England
[2] Kyoto Univ, Dept Mat Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan
关键词
Soldering; Undercooling; Solidification; Synchrotron radiation; Intermetallic compounds (IMCs); LEAD-FREE SOLDERS; HETEROGENEOUS NUCLEATION; MECHANICAL-PROPERTIES; PLATE FORMATION; COOLING RATE; DROPLET SOLIDIFICATION; GRAIN-REFINEMENT; THERMAL FATIGUE; BETA-SN; IN-SITU;
D O I
10.1016/j.actamat.2023.118831
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Large Ag3Sn plates in solder joints can affect the reliability of electronics, however, the factors affecting their nucleation and morphology are not well understood. Here, the faceted solidification of Ag3Sn was studied as a function of melt undercooling, revealing transitions from single crystal {001} plates to cyclic twinned plates and then to highly branched structures created by twin mediated branching. Real-time X-ray imaging proved that Ag3Sn cyclic twins come from a common point, indicating they initiate in the process of nucleation or in the very early stages of growth in the undercooled melt. Soldering to copper substrates significantly catalysed Ag3Sn nucleation. This is shown to be due to constitutional supercooling generated by Ag solute rejection into the liquid ahead of the Cu6Sn5 reaction layer, with additional contributions from geometrical catalysis in the grooves between Cu6Sn5 scallops and heterogeneous nucleation of Ag3Sn on Cu6Sn5. The relative ease of Ag3Sn nucleation on the Cu6Sn5 reaction layer is responsible for the large plates often reported in electronic solder joints.
引用
收藏
页数:15
相关论文
共 85 条
  • [1] Lead-free solders in microelectronics
    Abtew, M
    Selvaduray, G
    [J]. MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2000, 27 (5-6) : 95 - 141
  • [2] Ahmed S, 2016, INTERSOC C THERMAL T, P746, DOI 10.1109/ITHERM.2016.7517621
  • [3] Development of Sn-Ag-Cu and Sn-Ag-Cu-X alloys for Pb-free electronic solder applications
    Anderson, Iver E.
    [J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2007, 18 (1-3) : 55 - 76
  • [4] Dependence of Sn Grain Morphology of Sn-Ag-Cu Solder on Solidification Temperature
    Arfaei, B.
    Kim, N.
    Cotts, E. J.
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2012, 41 (02) : 362 - 374
  • [5] Microstructure and Damage Evolution During Thermal Cycling of Sn-Ag-Cu Solders Containing Antimony
    Belyakov, S. A.
    Coyle, R. J.
    Arfaei, B.
    Xian, J. W.
    Gourlay, C. M.
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2021, 50 (03) : 825 - 841
  • [6] Recommended values for the βSn solidus line in Sn-Bi alloys
    Belyakov, S. A.
    Gourlay, C. M.
    [J]. THERMOCHIMICA ACTA, 2017, 654 : 65 - 69
  • [7] Heterogeneous nucleation of βSn on NiSn4, PdSn4 and PtSn4
    Belyakov, S. A.
    Gourlay, C. M.
    [J]. ACTA MATERIALIA, 2014, 71 : 56 - 68
  • [8] Special grain boundaries based on local symmetries
    Bendersky, L. A.
    Cahn, J. W.
    [J]. JOURNAL OF MATERIALS SCIENCE, 2006, 41 (23) : 7683 - 7690
  • [9] THEORY FOR THE TRAPPING OF DISORDER AND SOLUTE IN INTERMETALLIC PHASES BY RAPID SOLIDIFICATION
    BOETTINGER, WJ
    AZIZ, MJ
    [J]. ACTA METALLURGICA, 1989, 37 (12): : 3379 - 3391
  • [10] MECHANICAL-PROPERTIES OF SN-AG3SN ALLOYS
    BROMLEY, JF
    VNUK, F
    SMITH, RW
    [J]. JOURNAL OF MATERIALS SCIENCE, 1983, 18 (10) : 3143 - 3153