Complex dielectric function of thiazolothiazole thin films determined by spectroscopic ellipsometry

被引：4

作者：

Shuchi, Nuren ^{[1
]}

Mower, Jackson ^{[2
]}

Stinson, V. Paige ^{[1
]}

Mclamb, Micheal J. ^{[1
]}

Boreman, Glenn D. ^{[1
]}

Walter, Micheal G. ^{[2
]}

Hofmann, Tino ^{[1
]}

机构：

[1] Univ N Carolina, Dept Phys & Opt Sci, 9201 Univ City Blvd, Charlotte, NC 28223 USA

[2] Univ N Carolina, Dept Chem, 9201 Univ City Blvd, Charlotte, NC 28223 USA

来源：

OPTICAL MATERIALS EXPRESS | 2023年 / 13卷 / 06期

基金：

美国国家卫生研究院; 美国国家科学基金会;

关键词：

OPTICAL-PROPERTIES; EFFICIENT;

D O I：

10.1364/OME.487598

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this paper, the complex dielectric function of 2,5-bis(N,N-dibutyl-4-aminophenyl) thiazolo[5,4-d]thiazole is reported. Thin films of this material were obtained by spin coating on a silicon substrate. The samples were investigated using spectroscopic ellipsometry in the spectral range from 354 nm to 1907 nm at multiple angles of incidence. The ellipsometric data were analyzed using a stratified-layer model composed of a thiazolothiazole thin film, a native SiO2 oxide, and a Si substrate. The model dielectric function of the thiazolothiazole thin film was modeled using a series of Tauc-Lorentz and Gaussian oscillators. The best-model calculated data reproduces the experimental data very well. The bandgap of TTz is reported and found to be in good agreement with density functional theory calculations reported earlier. & COPY; 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement

引用

页码：1589 / 1595

页数：7

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