We present a new test of non-randomness that tests both the lower and the upper critical limit of a chi 2-statistic. While checking the upper critical value has been employed by other tests, we argue that also the lower critical value should be examined for non-randomness. To this end, we prepare a binary sequence where all possible bit strings of a certain length occurs the same number of times and demonstrate that such sequences pass a well-known suite of tests for non-randomness. We show that such sequences can be compressed, and therefore are somewhat predictable and thus not fully random. The presented test can detect such non-randomness, and its novelty rests on analysing fixed-length bit string frequencies that lie closer to the a priori probabilities than could be expected by chance alone.
机构:
Victoria Univ, Sch Math Stat & Comp Sci, Wellington, New Zealand
Univ Amsterdam, Inst Log Language & Computat, NL-1090 GE Amsterdam, NetherlandsVictoria Univ, Sch Math Stat & Comp Sci, Wellington, New Zealand
机构:
Univ Salerno, Dipartimento Informat & Applicaz, I-84081 Baronissi, SA, ItalyUniv Salerno, Dipartimento Informat & Applicaz, I-84081 Baronissi, SA, Italy
De Bonis, A
论文数: 引用数:
h-index:
机构:
De Santis, A
STACS 2000: 17TH ANNUAL SYMPOSIUM ON THEORETICAL ASPECT OF COMPUTER SCIENCE,
2000,
1770
: 626
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638