A 79 pW, 106 ppm/°C NMOS-only current reference with leakage current isolation based on body bias technique

被引:8
作者
Huang, Wenjian [1 ,2 ]
Zeng, Yanhan [1 ,2 ]
Yang, Jingci [1 ,2 ]
Li, Yongfu [3 ]
机构
[1] Guangzhou Univ, Sch Elect & Commun Engn, Guangzhou, Peoples R China
[2] Guangzhou Univ, Dept Educ Guangdong Prov, Key Lab Si Based Informat Mat & Devices & Integrat, Guangzhou, Peoples R China
[3] Shanghai Jiao Tong Univ, Shanghai, Peoples R China
基金
中国国家自然科学基金;
关键词
Current reference; Body bias; Leakage isolation; Ultra-low-power; CURRENT REFERENCE CIRCUIT; VOLTAGE REFERENCE; COMPENSATION; GENERATOR;
D O I
10.1016/j.aeue.2023.154539
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A pico-watt, NMOS-only current reference has been proposed and simulated using 0.18-mu m deep N-well CMOS process in this paper. To significantly reduce the power consumption to 79 pW and minimal operating voltage to 0.8 V, body bias technique is introduced. A level shift is proposed and used for isolating the N-channel/P-sub diode leakage current, which decrease the temperature coefficient to 106 ppm/degrees C when temperature changes from 0 to 125 degrees C. Besides, the line sensitivity and line regulation are obtained as 1.39%/V and 0.31%/V, respectively.
引用
收藏
页数:9
相关论文
共 33 条
[11]   Mutual compensation of mobility and threshold voltage temperature effects with applications in CMOS circuits [J].
Filanovsky, IM ;
Allam, A .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS, 2001, 48 (07) :876-884
[12]   A 26-ppm/°C, 13.2-ppm/V, 0.11%-inaccuracy picowatt voltage reference with PVT compensation and fast startup [J].
Hu, Jinlong ;
Xu, Huachao ;
Wang, Jin ;
Liang, Ke ;
Lu, Chao ;
Li, Guofeng .
MICROELECTRONICS JOURNAL, 2021, 115
[13]   A novel precision CMOS current reference for IoT systems [J].
Hu, Jinlong ;
Lu, Chao ;
Xu, Huachao ;
Wang, Jin ;
Liang, Ke ;
Li, Guofeng .
AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS, 2021, 130
[14]   A-40 °C to 120 °C, 169 ppm/°C Nano-Ampere CMOS Current Reference [J].
Huang, Qiwei ;
Zhan, Chenchang ;
Wang, Lidan ;
Li, Zhiqun ;
Pan, Quan .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2020, 67 (09) :1494-1498
[15]  
Ji Y, 2017, ISSCC DIG TECH PAP I, P100, DOI 10.1109/ISSCC.2017.7870280
[16]  
Lee I, 2017, IEEE ASIAN SOLID STA, P265, DOI 10.1109/ASSCC.2017.8240267
[17]   A 1.4-μW 24.9-ppm/°C Current Reference With Process-Insensitive Temperature Compensation in 0.18-μm CMOS [J].
Lee, Junghyup ;
Cho, SeongHwan .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2012, 47 (10) :2527-2533
[18]   A Family of Current References Based on 2T Voltage References: Demonstration in 0.18-μm With 0.1-nA PTAT and 1.1-μA CWT 38-ppm/°C Designs [J].
Lefebvre, Martin ;
Bol, David .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2022, 69 (08) :3237-3250
[19]   A self-protected, high-efficiency CMOS rectifier using reverse DC feeding self-body-biasing technique for far-field RF energy harvesters [J].
Moghaddam, Amin Khalili ;
Choo, Alexander Chia Chun ;
Ramiah, Harikrishnan ;
Pakkirisami, Kishore Kumar .
AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS, 2022, 152
[20]   Design methodology for MOSFET-based voltage reference circuits implemented in 28 nm CMOS technology [J].
Mohammed, Mahmood ;
Abugharbieh, Khaldoon ;
Abdelfattah, Mahmoud ;
Kawar, Sanad .
AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS, 2016, 70 (05) :568-577