Analysis of quantum effects in metal oxide semiconductor field effect transistor in fractal dimensions

被引:8
作者
El-Nabulsi, Rami Ahmad [1 ,2 ]
Anukool, Waranont [1 ,2 ,3 ]
机构
[1] Chiang Mai Univ, Fac Engn, Ctr Excellence Quantum Technol, Chiang Mai 50200, Thailand
[2] Chiang Mai Univ, Fac Sci, Res Ctr Quantum Technol, Chiang Mai 50200, Thailand
[3] Chiang Mai Univ, Fac Sci, Dept Phys & Mat Sci, Chiang Mai 50200, Thailand
关键词
Quantum effects; Semiconducting; Modeling; MOSFET; ELECTRON;
D O I
10.1557/s43579-023-00334-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The MOSFET is a semiconductor microelectronic single-chip used in different technical aspects in computer engineering and nanotechnology. However, there are many self-assembly micro- and nano-electronic processes generating fractal patterns where millions of metallic nanoparticles are self-assembled into fractal electronic circuits. This proves the importance of fractals in nano-devices such as MOSFET. In this letter, we study quantum effects on MOSFET in fractal dimensions based on the concept of "product-like fractal measure " introduced recently in literature by Li and Ostoja-Starzewski. This study shows that fractal quantum mechanical effects occurring in micro- and nanoelectronics deserve to be considered seriously.
引用
收藏
页码:233 / 239
页数:7
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