Vertical PtOx/Pt/β-Ga2O3 Schottky diodes with high permittivity dielectric field plate for low leakage and high breakdown voltage

被引:23
作者
Farzana, Esmat [1 ]
Roy, Saurav [1 ]
Hendricks, Nolan S. [1 ,2 ]
Krishnamoorthy, Sriram [1 ]
Speck, James S. [1 ]
机构
[1] Univ Calif Santa Barbara, Mat Dept, Santa Barbara, CA 93106 USA
[2] Air Force Res Lab, Sensors Directorate, Wright Patterson Afb, OH 45433 USA
关键词
BARRIER DIODES; BALIGAS FIGURE; 001; BETA-GA2O3; MERIT;
D O I
10.1063/5.0171876
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrate Schottky barrier engineering using PtOx/thin Pt Schottky contacts combined with edge termination using a high permittivity dielectric (ZrO2) field-plate for high-voltage vertical beta-Ga2O3 diodes. A systematic study of baseline bare Pt/beta-Ga2O3, PtOx/thin Pt/beta-Ga2O3, and PtOx/beta-Ga2O3 Schottky diode characteristics was performed, which revealed that the PtOx/thin Pt/beta-Ga2O3 contact can combine the advantages of both PtOx and Pt, allowing better reverse blocking performance than plain metal Pt/beta-Ga2O3 Schottky diodes and lower turn-on voltage than plain oxidized metal PtOx/beta-Ga2O3 ones. Moreover, the thin Pt interlayer in the PtOx/thin Pt/beta-Ga2O3 anode contact configuration, deposited by e-beam deposition, also provides plasma-free interface at the Schottky junction as opposed to the direct sputter deposited PtOx contacts of the PtOx/beta-Ga2O3 diodes. We further implemented a high permittivity dielectric (ZrO2) field plate in PtOx/thin Pt/beta-Ga2O3 diodes that assisted in edge-field management and enabled a breakdown voltage to similar to 2.34 kV. These results indicate that the PtOx/thin Pt/beta-Ga2O3 Schottky contact, combined with a high permittivity field-plate, will be promising to enable Schottky barrier engineering for high-performance and efficient vertical beta-Ga2O3 power switches.
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页数:6
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