Influence of microscope settings on dislocation imaging in transmission forescattered electron imaging (t-FSEI)

This work analyzes the influence of several microscope settings, namely, sample-forescattered electron detector (FSD) distance, and tilting conditions on the characteristics of the dislocation contrast imaged in transmission forescattered electron imaging (t-FSEI). The dislocation contrast behaviors of characteristic dislocation configurations of two Fe-based alloys, namely an & alpha;'-martensitic (body-centered cubic, bcc) Fe-33Ni alloy (wt%), and an austenitic (face-centered cubic, fcc) Fe-30Mn-6.5Al-0.3C alloy (wt%) were investigated on thin foil samples by using different on-axis transmission Kikuchi diffraction (TKD) configurations, namely t-FSEI, bright-field (BF) tFSEI and electron channeling contrast imaging (ECCI). The set-ups use transmission Kikuchi electron patterns to orient the crystal into controlled diffraction conditions. Imaging parameters such as dislocation contrast intensity and information depth are analyzed and compared to those obtained in the ECCI mode under the same microscope conditions. These effects are associated with the attenuation of Bragg scattering by high-angle scattering processes and the electron channeling mechanism, respectively. The experimental analysis sets the microscope settings for optimum dislocation imaging in t-FSEI.