Environmental Doping-Induced Degradation of the Quantum Anomalous Hall Insulators
被引:3
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作者:
Tay, Han
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Penn State Univ, Dept Phys, University Pk, PA 16802 USAPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Tay, Han
[1
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Zhao, Yi-Fan
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Penn State Univ, Dept Phys, University Pk, PA 16802 USAPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Zhao, Yi-Fan
[1
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Zhou, Ling-Jie
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Penn State Univ, Dept Phys, University Pk, PA 16802 USAPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Zhou, Ling-Jie
[1
]
Zhang, Ruoxi
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Penn State Univ, Dept Phys, University Pk, PA 16802 USAPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Zhang, Ruoxi
[1
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Yan, Zi-Jie
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Penn State Univ, Dept Phys, University Pk, PA 16802 USAPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Yan, Zi-Jie
[1
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Zhuo, Deyi
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Penn State Univ, Dept Phys, University Pk, PA 16802 USAPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Zhuo, Deyi
[1
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Chan, Moses H. W.
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Penn State Univ, Dept Phys, University Pk, PA 16802 USAPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Chan, Moses H. W.
[1
]
Chang, Cui-Zu
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机构:
Penn State Univ, Dept Phys, University Pk, PA 16802 USA
Penn State Univ, Mat Res Inst, University Pk, PA 16802 USAPenn State Univ, Dept Phys, University Pk, PA 16802 USA
Chang, Cui-Zu
[1
,2
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机构:
[1] Penn State Univ, Dept Phys, University Pk, PA 16802 USA
[2] Penn State Univ, Mat Res Inst, University Pk, PA 16802 USA
The quantum anomalous Hall (QAH) insulator carries dissipation-free chiral edge current and thus provides a unique opportunity to develop energy-efficient transformative information technology. Despite promising advances, the QAH insulator has thus far eluded any practical applications. In addition to its low working temperature, the QAH state in magnetically doped topological insulators usually deteriorates with time in ambient conditions. In this work, we store three QAH devices with similar initial properties in different environments. The QAH device without a protection layer in air shows clear degradation and becomes hole-doped. The QAH device kept in an argon glovebox without a protection layer shows no measurable degradation after 560 h, and the device protected by a 3 nm AlOx protection layer in air shows minimal degradation with stable QAH properties. Our work shows a route to preserve the dissipation-free chiral edge state in QAH devices for potential applications in quantum information technology.
机构:
Int Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, IndiaInt Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, India
Mane, Rahul B.
Sahoo, Ramkrishna
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机构:
Int Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, IndiaInt Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, India
Sahoo, Ramkrishna
Reddy, Bapathi Kumaar Swamy
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h-index: 0
机构:
Int Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, IndiaInt Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, India
Reddy, Bapathi Kumaar Swamy
Ravula, Vijay
论文数: 0引用数: 0
h-index: 0
机构:
Int Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, IndiaInt Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, India
Ravula, Vijay
Panigrahi, Bharat B.
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h-index: 0
机构:
Indian Inst Technol Hyderabad, Dept Mat Sci & Met Engn, Sangareddy, Telangana, IndiaInt Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, India
Panigrahi, Bharat B.
Borse, Pramod H.
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h-index: 0
机构:
Int Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, IndiaInt Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, India
Borse, Pramod H.
Chakravarty, Dibyendu
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h-index: 0
机构:
Int Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, IndiaInt Adv Res Ctr Powder Met & New Mat ARCI, Balapur PO, Hyderabad 500005, Telangana, India
机构:
MIT, Francis Bitter Magnet Lab, 77 Massachusetts Ave, Cambridge, MA 02139 USAMIT, Francis Bitter Magnet Lab, 77 Massachusetts Ave, Cambridge, MA 02139 USA
Chang, Cui-Zu
Li, Mingda
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机构:
MIT, Dept Mech Engn, Cambridge, MA 02139 USA
MIT, Dept Nucl Engn, Cambridge, MA 02139 USAMIT, Francis Bitter Magnet Lab, 77 Massachusetts Ave, Cambridge, MA 02139 USA
机构:
RIKEN, Ctr Emergent Matter Sci, Wako, Saitama 3510198, Japan
Japan Sci & Technol Agcy JST, PRESTO, Chiyoda Ku, Tokyo 1020075, JapanRIKEN, Ctr Emergent Matter Sci, Wako, Saitama 3510198, Japan
Takahashi, Kei S.
Kawasaki, Masashi
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机构:
RIKEN, Ctr Emergent Matter Sci, Wako, Saitama 3510198, Japan
Univ Tokyo, Dept Appl Phys, Tokyo 1138656, Japan
Univ Tokyo, Quantum Phase Elect Ctr, Tokyo 1138656, JapanRIKEN, Ctr Emergent Matter Sci, Wako, Saitama 3510198, Japan