LN2 Calibrated Noise Source Family Aids in Noise Figure Measurements

被引:0
|
作者
Eravant [1 ]
机构
[1] Sage Millimeter Inc Torrance, Torrance, CA 90501 USA
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:102 / 103
页数:2
相关论文
共 50 条
  • [1] Calibrated noise figure measurements in vector network analyser
    Otegi, N
    Collantes, JM
    Sayed, M
    ELECTRONICS LETTERS, 2005, 41 (18) : 999 - 1000
  • [2] NOISE IN TRANSISTOR CIRCUITS .2. NOISE FIGURE - NEGATIVE FEEDBACK - MEASUREMENTS
    BAXANDALL, PJ
    WIRELESS WORLD, 1968, 74 (1398): : 454 - +
  • [3] Measure Noise Without A Calibrated Source
    Monzello, Roy
    MICROWAVES & RF, 2013, 52 (04) : 68 - +
  • [4] Cold-Source Measurements for Noise Figure Calculation in Spectrum Analyzers
    Otegi, N.
    Collantes, J. M.
    Sayed, M.
    67TH ARFTG MICROWAVE MEASUREMENTS CONFERENCE: MEASUREMENTS AND DESIGN OF HIGH POWER DEVICES AND SYSTEMS, 2007, : 223 - +
  • [5] DETERMINING NOISE TEMPERATURE OF A NOISE SOURCE USING CALIBRATED NOISE SOURCES AND AN RF ATTENUATOR
    Kang, Tae-Weon
    Kim, Jeong-Hwan
    Lee, Joo-Gwang
    Park, Jeong-Il
    Kim, Dae-Chan
    2010 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS CPEM, 2010, : 745 - 746
  • [6] Determining Noise Temperature of a Noise Source Using Calibrated Noise Sources and an RF Attenuator
    Kang, Tae-Weon
    Kim, Jeong-Hwan
    Lee, Joo-Gwang
    Park, Jeong-Il
    Kim, Dae-Chan
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2011, 60 (07) : 2558 - 2563
  • [7] Analysis of noise parameters extraction from noise figure measurements
    Sanderson, J
    Kumar, BP
    Branner, GR
    PROCEEDINGS OF THE 39TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS I-III, 1996, : 377 - 380
  • [8] NOISE FIGURE FOR NEGATIVE SOURCE RESISTANCE
    HAUS, HA
    PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1962, 50 (10): : 2135 - &
  • [9] NOISE FIGURE FROM SOURCE RESISTANCE
    JENKINS, ER
    ELECTRONIC ENGINEER, 1968, 27 (01): : 52 - &
  • [10] Noise figure measurements on nonlinear devices
    Geens, A
    Rolain, Y
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2001, 50 (04) : 971 - 975