High operating temperature mid-wavelength infrared HgCdTe focal plane arrays

被引:0
作者
Qin, Gang [1 ]
Qin, Qiang [1 ]
He, Tian-Ying [1 ]
Song, Lin-Wei [1 ]
Zuo, Da-Fan [1 ]
Yang, Chao-Wei [1 ]
Li, Hong-Fu [1 ]
Li, Yi-Min [1 ]
Kong, Jin-Cheng [1 ]
Zhao, Peng [1 ]
Zhao, Jun [1 ]
机构
[1] Kunming Inst Phys, Kunming 650223, Peoples R China
关键词
high operating temperature; MWIR; HgCdTe; NETD; operability; TECHNOLOGY;
D O I
10.11972/j.issn.1001-9014.2023.05.004
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper presents the recent progress in the research of high operating temperature (HOT) mid -wave-length infrared (MWIR) HgCdTe focal plane arrays (FPAs) at Kunming Institute of Physics. By optimizing the structural parameters of mid-wavelength infrared HgCdTe detectors, a 640x512@15 & mu;m mid-wavelength infrared focal plane array (FPA) was fabricated based on high-quality in situ indium-doped HgCdTe film grown by liquid phase epitaxy (LPE) using arsenic-ion-implanted p-on-n planar junction device technology. The spectral response, device dark current, noise equivalent temperature difference (NETD), operability, and the distribution of defective pixels of the prepared p-on-n chip arrays at various operating temperatures were tested using a variable temperature Dewar. The test results demonstrate that the detector has the ability to operate at temperatures above 180 K.
引用
收藏
页码:588 / 593
页数:6
相关论文
共 26 条
[1]  
Capper P, 2010, J PHYS CHEM SOLIDS, V47, P65
[2]  
CHU Jun-Hao, 2005, Narrow-gap semiconductor physics
[3]  
Daniels A., 2010, Field Guide to Infrared Systems, Detectors, and FPAs
[4]   Progress of MCT Detector Technology at AIM Towards Smaller Pitch and Lower Dark Current [J].
Eich, D. ;
Schirmacher, W. ;
Hanna, S. ;
Mahlein, K. M. ;
Fries, P. ;
Figgemeier, H. .
JOURNAL OF ELECTRONIC MATERIALS, 2017, 46 (09) :5448-5457
[5]   State-of-the-Art HgCdTe at Raytheon Vision Systems [J].
Fulk, C. ;
Radford, W. ;
Buell, D. ;
Bangs, J. ;
Rybnicek, K. .
JOURNAL OF ELECTRONIC MATERIALS, 2015, 44 (09) :2977-2980
[6]   ENERGY-GAP VERSUS ALLOY COMPOSITION AND TEMPERATURE IN HG1-XCDXTE [J].
HANSEN, GL ;
SCHMIT, JL ;
CASSELMAN, TN .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (10) :7099-7101
[7]   Low-Frequency Noise Characteristics of HgCdTe Infrared Photodiodes Operating at High Temperatures [J].
Hassis, W. ;
Gravrand, O. ;
Rothman, J. ;
Benahmed, S. .
JOURNAL OF ELECTRONIC MATERIALS, 2013, 42 (11) :3288-3296
[8]   1/f Noise in HgCdTe Focal-Plane Arrays [J].
Kinch, M. A. ;
Strong, R. L. ;
Schaake, C. A. .
JOURNAL OF ELECTRONIC MATERIALS, 2013, 42 (11) :3243-3251
[9]  
Kinch MA, 2005, J ELECTRON MATER, V34, P880, DOI [10.1007/s11664-005-0036-2, 10.1007/s11664-005-0037-1]
[10]   The Future of Infrared; III-Vs or HgCdTe? [J].
Kinch, Michael A. .
JOURNAL OF ELECTRONIC MATERIALS, 2015, 44 (09) :2969-2976