Influence of Graphene Stability on III-Nitride Remote Epitaxy for Exfoliation

被引:2
作者
Han, Xu [1 ,2 ]
Yu, Jiadong [3 ]
Yang, Peilong [1 ]
Liu, Bo [1 ]
Wang, Xun [1 ]
Hao, Zhibiao [1 ,2 ]
Luo, Yi [1 ,2 ]
Sun, Changzheng [1 ,2 ]
Han, Yanjun [1 ,2 ]
Xiong, Bing [1 ,2 ]
Wang, Jian [1 ,2 ]
Li, Hongtao [1 ,2 ]
Wang, Lai [1 ,2 ]
机构
[1] Tsinghua Univ, Beijing Natl Res Ctr Informat Sci & Technol BNRist, Dept Elect Engn, Beijing 100084, Peoples R China
[2] Tsinghua Univ, Ctr Flexible Elect Technol, Beijing 100084, Peoples R China
[3] Chinese Acad Sci, Xian Inst Opt & Precis Mech, Xian 710119, Peoples R China
基金
中国国家自然科学基金; 中国博士后科学基金;
关键词
III-nitride; exfoliation; MOCVD; graphene; remote epitaxy; DOPED GRAPHENE; GAN; LAYER;
D O I
10.1021/acsanm.3c02811
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Remoteepitaxy via graphene has acquired much attention becauseof its potential for epi-layer mechanical exfoliation. The stabilityof graphene during the epitaxy process is a key point in realizingepi-layer exfoliation. In this work, GaN and AlN buffer layers weregrown on a graphene-coated AlN/sapphire template and studied for thestability of graphene during the different stages of III-nitrides'remote epitaxy. The annealing experiments of graphene in differentatmospheres illustrate that N-2 carrier gas is the betterchoice to protect graphene. The graphene transition layer can remainstable during the low-temperature GaN or AlN buffer growth process,making the epi-layer exfoliable. However, when the temperature increasedto a common value for GaN growth in MOCVD, recrystallization of thebuffer layers happened and the graphene transition layer could bedestroyed. As a result, the epi-layers cannot be exfoliated in thiscase. These results illustrate that the recrystallization processshould be avoided or weakened to achieve exfoliation of the epi-layer.
引用
收藏
页码:15159 / 15165
页数:7
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