共 22 条
[21]
Comparison of neutron induced single event upsets in 14 nm FinFET and 65 nm planar static random access memory devices
[J].
Zhang Zhan-Gang
;
Lei Zhi-Feng
;
Tong Teng
;
Li Xiao-Hui
;
Wang Song-Lin
;
Liang Tian-Jiao
;
Xi Kai
;
Peng Chao
;
He Yu-Juan
;
Huang Yun
;
En Yun-Fei
.
ACTA PHYSICA SINICA,
2020, 69 (05)

Zhang Zhan-Gang
论文数: 0 引用数: 0
h-index: 0
机构:
China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China

Lei Zhi-Feng
论文数: 0 引用数: 0
h-index: 0
机构:
China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China

Tong Teng
论文数: 0 引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China

Li Xiao-Hui
论文数: 0 引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China

Wang Song-Lin
论文数: 0 引用数: 0
h-index: 0
机构:
Spallat Neutron Source Sci Ctr, Dongguan 523803, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China

Liang Tian-Jiao
论文数: 0 引用数: 0
h-index: 0
机构:
Spallat Neutron Source Sci Ctr, Dongguan 523803, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China

Xi Kai
论文数: 0 引用数: 0
h-index: 0
机构:
Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China

Peng Chao
论文数: 0 引用数: 0
h-index: 0
机构:
China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China

He Yu-Juan
论文数: 0 引用数: 0
h-index: 0
机构:
China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China

Huang Yun
论文数: 0 引用数: 0
h-index: 0
机构:
China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China

En Yun-Fei
论文数: 0 引用数: 0
h-index: 0
机构:
China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China China Elect Prod Reliabil & Environm Testing Res, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou 510610, Peoples R China
[22]
Zhang ZX., 2009, EQUIP ENV ENG, V6, P5, DOI DOI 10.3969/J.ISSN.1672-9242.2009.04.002