Improved interface microstructure between crystalline silicon and nanocrystalline silicon oxide window layer of silicon heterojunction solar cells

被引:7
作者
Zhou, Yinuo [1 ,2 ]
Zhang, Liping [1 ,2 ]
Liu, Wenzhu [1 ,2 ]
Zhang, Honghua [1 ,2 ]
Huang, Shenglei [1 ,2 ,3 ]
Lan, Shihu [4 ]
Zhao, Hui [4 ]
Fu, Haoxin [4 ]
Han, Anjun [1 ]
Li, Zhenfei [1 ,2 ]
Jiang, Kai [1 ,2 ]
Yu, Xiangrui [5 ]
Zhao, Dongming [5 ]
Li, Rui [6 ]
Meng, Fanying [1 ,2 ]
Liu, Zhengxin [1 ,2 ,3 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol SIMIT, Res Ctr New Energy Technol RCNET, Natl Key Lab Mat Integrated Circuits, Shanghai 200050, Peoples R China
[2] Univ Chinese Acad Sci UCAS, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
[3] ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China
[4] Tongwei Solar Chengdu Co Ltd, Chengdu 610200, Peoples R China
[5] Huaneng Clean Energy Res Inst, Beijing 102209, Peoples R China
[6] Huaneng Gansu Energy Dev Co Ltd, Lanzhou 730070, Gansu, Peoples R China
关键词
Microstructure of silicon films; Silicon heterojunction solar cells; Intrinsic hydrogenated amorphous silicon; Nanocrystalline silicon oxide; Ions bombardment; Surface passivation; CHEMICAL-VAPOR-DEPOSITION; H THIN-FILMS; MICROCRYSTALLINE SILICON; STRUCTURAL-CHANGES; HIGH-EFFICIENCY; HYDROGEN; PASSIVATION; MECHANISM; STRESS; GROWTH;
D O I
10.1016/j.solmat.2023.112652
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
N-type hydrogenated nanocrystalline silicon oxide (nc-SiOx:H) is potential to enhance the performance of silicon heterojunction solar cells, but the raised plasma damage on underlying layer during the nc-SiOx:H deposition with a high-volume fraction of hydrogen is a burning issue. The underlying intrinsic hydrogenated amorphous silicon (i-a-Si:H) bilayer between n-type crystalline silicon (c-Si) and n-type nc-SiOx:H has been investigated by modulating silane (SiH4) gas flow rate (GFR) of interface porous layer. It has been found that the initial H-rich ia-Si:H bilayer deposited by interfacial 1600 sccm GFR with relatively stable larger voids diameter and less voids number density can not only withstand hydrogen ions bombardment but also passivate c-Si surface well. Meanwhile, it also has been verified that the optimal n-seed deposition can further enhance both total hydrogen content and hydrogen content in compact structure to promote c-Si surface passivation and carrier transportation. The optimized SiH4 GFR for the interfacial i-a-Si:H growth and the appropriate deposition time of nseed layer have been applied into the front passivation layer of silicon heterojunction solar cells, thus a high efficiency of approximate 25 % with high VOC and FF has been achieved.
引用
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页数:8
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