Pulsed laser deposition of ZnGa2O4 thin films on Al2O3 and Si substrates for deep optoelectronic devices applications

被引:11
|
作者
Guo, Anqi [1 ]
Zhang, Lichun [1 ,2 ]
Cao, Ning [1 ]
Lu, Taiping [2 ]
Zhu, Yadan [2 ]
Zhou, Zhiying [1 ]
He, Shunli [1 ]
Xia, Bin [1 ]
Zhao, Fengzhou [1 ]
机构
[1] Ludong Univ, Sch Phys & Optoelect Engn, Yantai 264025, Peoples R China
[2] Ludong Univ, Sch Integrated Circuits, Yantai 264025, Peoples R China
基金
中国国家自然科学基金;
关键词
deep-ultraviolet photodetectors; pulsed laser deposition; thin films; ultra-wide band gap semiconductor; ZnGa2O4; ULTRAVIOLET PHOTODETECTOR; GALLIUM OXIDE; PHOTORESPONSE; PHOSPHORS;
D O I
10.35848/1882-0786/acb98c
中图分类号
O59 [应用物理学];
学科分类号
摘要
Due to the ultra-wideband gap, high transmittance in the ultraviolet (UV) region, and excellent environmental stability, zinc gallium oxide (ZnGa2O4) has attracted considerable interest in deep-ultraviolet photodetectors. Here, ZnGa2O4 thin film was fabricated on different substrates by pulsed laser deposition with a post-annealing process under an oxygen atmosphere. It is found that the substrates have a great impact on the morphology, structure, and crystal quality of thin film. After annealing, the thin film quality has been improved. The metal-semiconductor-metal photodetector shows excellent reproducible characteristics and fast response performance, which demonstrates great potential in next-generation optoelectronic devices.
引用
收藏
页数:5
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