Statistical Methods for Reliability Data

被引：0

|

作者：

Ng, Hon Keung Tony ^{[1
]}

机构：

[1] Bentley Univ, Dept Math Sci, 175 Forest St, Waltham, MA 02452 USA

来源：

JOURNAL OF QUALITY TECHNOLOGY | 2023年 / 55卷 / 03期

关键词：

D O I：

10.1080/00224065.2023.2165463

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：386 / 387

页数：2

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