Design of a high performance CNFET 10T SRAM cell at 5nm technology node

被引:6
作者
Yang, Zihao [1 ,2 ,3 ]
Yin, Minghui [1 ,2 ,3 ]
You, Yunxia [1 ,2 ,3 ]
Li, Zhiqiang [1 ,2 ,3 ]
Liu, Xin [2 ]
Zhang, Weihua [1 ,2 ,3 ]
机构
[1] Chinese Acad Sci, Inst Microelect, EDA Ctr, Beijing 100029, Peoples R China
[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
[3] Beijing Key Lab Three Dimens & Nanometer Integrate, Beijing 100029, Peoples R China
来源
IEICE ELECTRONICS EXPRESS | 2023年 / 20卷 / 12期
关键词
CNFET; SRAM; static power consumption; read static noise margin(RSNM); energy-delay-product(EDP); CARBON NANOTUBES;
D O I
10.1587/elex.20.20230171
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article proposes a CNFET 10T SRAM cell based on Stanford Virtual Source model at 5nm technology node, through optimization design and simulation analysis to select optimum gate widths of transistors to ensure best performance in terms of stability, speed and power consumption. We compare the proposed 10T CNFET SRAM with the optimized 6T CNFET SRAM in [9]. It was found that the timing and power characteristics of the proposed 10T SRAM cell is better than that of the 6T structure, the static power consumption is greatly reduced while the RSNM is improved by 93.5%, read and write EDP are improved by 68.5% and 96%, respectively.
引用
收藏
页数:6
相关论文
共 28 条
[1]  
Akinwande D, 2011, CARBON NANOTUBE AND GRAPHENE DEVICE PHYSICS, P191
[2]   Carbon nanotubes for high-performance electronics - Progress and prospect [J].
Appenzeller, J. .
PROCEEDINGS OF THE IEEE, 2008, 96 (02) :201-211
[3]   An 8T-SRAM for variability tolerance and low-voltage operation in high-performance caches [J].
Chang, Leland ;
Montoye, Robert K. ;
Nakamura, Yutaka ;
Batson, Kevin A. ;
Eickemeyer, Richard J. ;
Dennard, Robert H. ;
Haensch, Wilfried ;
Jamsek, Damir .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2008, 43 (04) :956-963
[4]   Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation--Part I: CNFET Transistor Optimization [J].
Chen, Rongmei ;
Chen, Lin ;
Liang, Jie ;
Cheng, Yuanqing ;
Elloumi, Souhir ;
Lee, Jaehyun ;
Xu, Kangwei ;
Georgiev, Vihar P. ;
Ni, Kai ;
Debacker, Peter ;
Asenov, Asen ;
Todri-Sanial, Aida .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2022, 30 (04) :432-439
[5]   Assessment of CNTFET Based Circuit Performance and Robustness to PVT Variations [J].
Cho, Geunho ;
Kim, Yong-Bin ;
Lombardi, Fabrizio .
2009 52ND IEEE INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1 AND 2, 2009, :1106-1109
[6]  
Dhilleswararao P, 2014, 2014 INTERNATIONAL CONFERENCE ON ELECTRONICS AND COMMUNICATION SYSTEMS (ICECS)
[7]  
Dresselhaus M. S., 2001, CARBON NANOTUBES SYN
[8]  
Elangovan M., 2019, STABILITY ANAL 6T CN, DOI [10.1109/ICDCSyst.2018.8605154, DOI 10.1109/ICDCSYST.2018.8605154]
[9]  
Emon D. H., 2012, 2012 7th International Conference on Electrical & Computer Engineering (ICECE), P213, DOI 10.1109/ICECE.2012.6471523
[10]   Techniques for leakage energy reduction in deep submicrometer cache memories [J].
Frustaci, Fabio ;
Corsonello, Pasquale ;
Perri, Stefania ;
Cocorullo, Giuseppe .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2006, 14 (11) :1238-1249