Tunable Hybrid Plasmonic Semiconductor Laser Based on Loss Perturbation

被引:1
|
作者
Saeidi, Shayan [1 ,2 ]
Berini, Pierre [2 ,3 ]
机构
[1] Univ Ottawa, Ctr Res Photon, Ottawa, ON K1N 6N5, Canada
[2] Univ Ottawa, Sch Elect Engn & Comp Sci, Ottawa, ON K1N 6N5, Canada
[3] Univ Ottawa, Ctr Res Photon, Dept Phys, Ottawa, ON K1N 6N5, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
Indium tin oxide; Laser modes; Laser tuning; Plasmons; Metals; MOS capacitors; Tuning; Semiconductor laser; plasmonic laser; hybrid laser; epsilon-near-zero material; ITO; MOS capacitor; INDIUM TIN OXIDE; INP; DESIGN; OPTIMIZATION; INDEX; CHIP;
D O I
10.1109/JQE.2023.3246987
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We propose a tunable plasmonic semiconductor laser that exploits loss perturbation as a tuning mechanism. A metal oxide semiconductor (MOS) capacitive structure is added on top of an edge-emitting Fabry-Perot (FP) diode laser, such that a hybrid plasmonic TM mode that overlaps partly with the MOS capacitor and the semiconductor gain region is supported as the lasing mode. We also propose the use of a layer of conductive oxide, e.g., indium tin oxide (ITO), as the semiconductor of the MOS structure, because the epsilon near zero (ENZ) condition can be attained therein under accumulation, thereby producing a very large change in the effective index of the hybrid plasmonic TM mode. The change in the imaginary part of the effective index is used to tune the lasing wavelength -exploiting loss perturbation to achieve laser tuning is paradigm-shifting. The laser proposed operates at telecom wavelengths, requiring an electrical forward bias to pump the active layer, and a gate voltage to drive the MOS tuning capacitor. Simulations yield a tuning range of over 7 nm in the O-band for a 100 mu m long FP laser cavity.
引用
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页数:8
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