A Virtual Knowledge Graph Based Approach for Object-Centric Event Logs Extraction

被引:6
作者
Xiong, Jing [1 ]
Xiao, Guohui [2 ,3 ,4 ]
Kalayci, Tahir Emre [5 ]
Montali, Marco [1 ]
Gu, Zhenzhen [1 ]
Calvanese, Diego [1 ,4 ,6 ]
机构
[1] Free Univ Bozen Bolzano, Bolzano, Italy
[2] Univ Bergen, Bergen, Norway
[3] Univ Oslo, Oslo, Norway
[4] Ontop SRL, Bolzano, Italy
[5] Virtual Vehicle Res GmbH, Graz, Austria
[6] Umea Univ, Umea, Sweden
来源
PROCESS MINING WORKSHOPS, ICPM 2022 | 2023年 / 468卷
关键词
Process mining; Object-Centric Event Logs; Virtual Knowledge Graphs; Ontology-based data access;
D O I
10.1007/978-3-031-27815-0_34
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Process mining is a family of techniques that support the analysis of operational processes based on event logs. Among the existing event log formats, the IEEE standard eXtensible Event Stream (XES) is the most widely adopted. In XES, each event must be related to a single case object, which may lead to convergence and divergence problems. To solve such issues, object-centric approaches become promising, where objects are the central notion and one event may refer to multiple objects. In particular, the Object-Centric Event Logs (OCEL) standard has been proposed recently. However, the crucial problem of extracting OCEL logs from external sources is still largely unexplored. In this paper, we try to fill this gap by leveraging the Virtual Knowledge Graph (VKG) approach to access data in relational databases. We have implemented this approach in the OnProm system, extending it to support both XES and OCEL standards. We have carried out an experiment with OnProm over the Dolibarr system. The evaluation results confirm that OnProm can effectively extract OCEL logs and the performance is scalable.
引用
收藏
页码:466 / 478
页数:13
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  • [13] Directed Acyclic Graph Extraction from Event Logs
    Vasilecas, Olegas
    Savickas, Titas
    Lebedys, Evaldas
    [J]. INFORMATION AND SOFTWARE TECHNOLOGIES, ICIST 2014, 2014, 465 : 172 - 181
  • [14] Extracting useful knowledge from event logs: A frequent itemset mining approach
    Djenouri, Youcef
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    Fournier-Viger, Philippe
    [J]. KNOWLEDGE-BASED SYSTEMS, 2018, 139 : 132 - 148
  • [15] A Profile Clustering Based Event Logs Repairing Approach for Process Mining
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    [J]. IEEE ACCESS, 2019, 7 : 17872 - 17881
  • [16] Metamodel of the Artifact-Centric Approach to Event Log Extraction from ERP Systems
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    Becejski-Vujaklija, Dragana
    [J]. INTERNATIONAL JOURNAL OF DECISION SUPPORT SYSTEM TECHNOLOGY, 2016, 8 (02) : 18 - 28
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    Ji, Zengyan
    Sui, Yuan
    Tian, Zhenzhen
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    [J]. ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE, 2023, 126
  • [18] Process Mining Approach Based on Partial Structures of Event Logs and Decision Tree Learning
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    Hirayama, Hideaki
    Hayase, Takeo
    Tahara, Yasuyuki
    Ohsuga, Akihiko
    [J]. PROCEEDINGS 2016 5TH IIAI INTERNATIONAL CONGRESS ON ADVANCED APPLIED INFORMATICS IIAI-AAI 2016, 2016, : 113 - 118
  • [19] Scalable alignment of process models and event logs: An approach based on automata and S-components
    Reissner, Daniel
    Armas-Cervantes, Abel
    Conforti, Raffaele
    Dumas, Marlon
    Fahland, Dirk
    La Rosa, Marcello
    [J]. INFORMATION SYSTEMS, 2020, 94
  • [20] Event Logs Pre-processing for Configurable Process Discovery: Ontology-Based Approach
    Khannat, Aicha
    Sbai, Hanae
    Kjiri, Laila
    [J]. 2020 6TH IEEE CONGRESS ON INFORMATION SCIENCE AND TECHNOLOGY (IEEE CIST'20), 2020, : 139 - 144