Surface modifications and optical studies of irradiated flexible PDMS materials

This work aimed to modify the surface properties of polydimethylsiloxane (PDMS) for used in optoelectronic devices utilizing handmade ion source. The films were exposed to hydrogen fluence of 6x10(17), 9x10(17), and 12x10(17) ions/cm(2). XRD as well as FTIR were used to reveal the changes in PDMS after irradiation. Similarly, SEM is employed to examine the morphological alterations of irradiated surfaces. The band gap and band tail of pristine and treated films were estimated using Tauc's methodology. By raising hydrogen fluence from 6x10(17) ions/cm(2) to 12x10(17) ions/cm(2), the band gap is lowered from 5.06 eV to 4.86 eV. Furthermore, the band tail energy is improved from 0.53 eV for PVA to 0.55 eV for 6x10(17) and to 0.63 eV for 9x10(17) ions/cm(2). In addition, the dispersion characteristics of were estimated using the Wemple Di-Domenico method. Moreover, the extinction coefficients and refractive index were calculated. The recorded relaxation time is reduced from 2.06x10(-7 )sec to 1.65x10(-7 )sec respectively, by enhancing ion fluence from 6x10(17) to 12x10(17) ions/cm(2). According to the finding results, ion beam irradiation is induced modification in the irradiated films for used in optical devices.