A Probabilistic Test for A-Diagnosability of Stochastic Discrete-Event Systems With Guaranteed Error Bound

被引:0
作者
Chen, Jun [1 ]
机构
[1] Oakland Univ, Dept Elect & Comp Engn, Rochester, MI 48374 USA
来源
IEEE CONTROL SYSTEMS LETTERS | 2023年 / 7卷
关键词
Probabilistic logic; Delays; Complexity theory; Stochastic processes; Sufficient conditions; Discrete-event systems; Automata; Discrete event systems; fault diagnosis; Index Terms; stochastic systems; randomized algorithms; FAULT-DIAGNOSIS; CODIAGNOSABILITY;
D O I
10.1109/LCSYS.2023.3290476
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This letter investigates the failure diagnosability of stochastic discrete-event systems (DES). Specifically, the A-Diagnosability (proposed by Thorsley et al., 2005) is studied, which requires every failure to be stochastically diagnosable with arbitrary probability and within a certain delay bound. The verification of A-Diagnosability was later shown to be PSPACE-Complete, and a polynomial testing algorithm likely does not exist. This letter fills this gap by providing a new necessary and sufficient condition for checking A-Diagnosability of stochastic DES, based on which a probabilistic test is also proposed. The complexity of the proposed algorithm is polynomial in the number of system states and events, with a sacrifice that the proposed test will also incur certain test errors. Furthermore, the balance between computing complexity and probability of test error is calibratable through a hyper-parameter. Several working examples are provided to illustrate the proposed verification condition and probabilistic test.
引用
收藏
页码:2833 / 2838
页数:6
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