Resonant x-ray diffraction study using circularly polarized x rays on antiferromagnetic TbB4

被引:4
作者
Misawa, R. [1 ]
Arakawa, K. [1 ]
Yoshioka, T. [1 ]
Ueda, H. [2 ]
Iga, F. [3 ]
Tamasaku, K. [4 ]
Tanaka, Y. [4 ]
Kimura, T. [1 ,5 ]
机构
[1] Univ Tokyo, Dept Adv Mat Sci, Kashiwa, Chiba 2778561, Japan
[2] Paul Scherrer Inst, SwissFEL, Forschungsstr 111, CH-5232 Villigen, Switzerland
[3] Ibaraki Univ, Grad Sch Sci & Engn, Mito 3108512, Japan
[4] RIKEN SPring 8 Ctr, Sayo, Hyogo 6795148, Japan
[5] Univ Tokyo, Dept Appl Phys, Tokyo 1138656, Japan
关键词
CRYSTAL;
D O I
10.1103/PhysRevB.108.134433
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Resonant x-ray diffraction (RXD) measurements at the Tb L3 and the M5 edges were carried out on a single crystal of a rare-earth tetraboride, TbB4, which exhibits antiferromagnetic (AFM) order breaking both space-inversion and time-reversal symmetries. Considering its crystallographic and magnetic symmetries, both the anisotropic tensor of susceptibility (ATS) scattering and the magnetic scattering contribute to space-groupforbidden odd00 reflections under the resonant conditions in the AFM phase. We found that the RXD intensity of odd00 reflections depends on the helicity of the circularly polarized incident x rays, which is reasonably explained in terms of the interference effect between the ATS and the magnetic scatterings. Furthermore, the circular dichroic RXD showed a sample-position dependence, which reflects spatial distributions of AFM domains in TbB4. Our study reveals that RXD using circularly polarized x rays is a powerful technique to probe not only the magnitude but also the sign of AFM order parameters and to spatially resolve AFM domains in materials breaking both space-inversion and time-reversal symmetries.
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页数:8
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