Manufacturability and mechanical reliability study for heterogeneous integration system in display (HiSID)

被引:2
|
作者
Long, Hao-Hui [1 ]
Ma, Hui-Cai [1 ]
Gao, Jia-Ying [1 ]
Zhang, Li [1 ]
Zhang, De-Ming [1 ]
Chen, Jian-Qiu [1 ]
机构
[1] Huawei Device Co Ltd, Shenzhen 518129, Guangdong, Peoples R China
关键词
Display; Heterogeneous integration system in display (HiSID); Manufacturability; Mechanical reliability; System on display panel (SoDP);
D O I
10.1007/s40436-022-00420-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, the system on display panel (SoDP) architecture, the primary stage of heterogeneous integration system in display (HiSID), is introduced for the first time. In this architecture, the driving components of display, which are supposed to be on the display flexible print circuit (FPC) in traditional architecture, are innovatively integrated onto the backside of display panel. Through the SoDP architecture, the simulated impact strain in the panel fan-out region can decrease about 30% compared to the traditional architecture, and SoDP provides more the 10 mm extra space in the in-plane Y-direction for holding a larger battery. Also, the SoDP is compatible with the current organic laser emitted diode (OLED) and system in package (SiP) processes. Besides the primary stage, this paper also presents a comprehensive and extensive analysis on the challenges of the manufacturability for the advanced stage of HiSID from four key technologies perspectives: device miniaturization, massive manufacturing, driving technology, and advanced heterogeneous integration.
引用
收藏
页码:191 / 202
页数:12
相关论文
共 9 条
  • [1] Manufacturability and mechanical reliability study for heterogeneous integration system in display (HiSID)
    Hao-Hui Long
    Hui-Cai Ma
    Jia-Ying Gao
    Li Zhang
    De-Ming Zhang
    Jian-Qiu Chen
    Advances in Manufacturing, 2023, 11 : 191 - 202
  • [2] Heterogeneous Integration System in Display (HiSID) for Next-Generation Terminal Device
    Long, Haohui
    Zhang, Li
    Ma, Huicai
    Li, Jianhui
    Xia, Jiye
    Zhang, Yunan
    Chen, Jianqiu
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2022, 12 (05): : 731 - 739
  • [3] A Study of the Mechanical Reliability of a MEMS Microphone
    Fang Wenxiao
    Huang Qinwen
    PROCEEDINGS OF THE 2013 20TH IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA 2013), 2013, : 716 - 719
  • [4] Study on the Manufacturability of X Dimension Fan Out Integration Package with Organic RDLs (XDFOI-O)
    Chen, Haijie
    Bian, Ziyao
    Liu, Tao
    Xie, Jielei
    Wu, Jingyu
    Lin, Yaojian
    Lee, Choon Heung
    Journal of Microelectronics and Electronic Packaging, 2024, 21 (01): : 14 - 19
  • [5] An Optimization Model for Crucial Key Pipes and Mechanical Reliability: A Case Study on a Water Distribution System in Taiwan
    Chih-Liang Kuo
    Nien-Sheng Hsu
    Water Resources Management, 2011, 25 : 763 - 775
  • [6] An Optimization Model for Crucial Key Pipes and Mechanical Reliability: A Case Study on a Water Distribution System in Taiwan
    Kuo, Chih-Liang
    Hsu, Nien-Sheng
    WATER RESOURCES MANAGEMENT, 2011, 25 (02) : 763 - 775
  • [7] The Study on Mechanical Reliability Design Method and Its Application
    Yang Yuanfan
    2012 INTERNATIONAL CONFERENCE ON FUTURE ELECTRICAL POWER AND ENERGY SYSTEM, PT A, 2012, 17 : 467 - 472
  • [8] A mechanical reliability study of 3-dB waveguide hybrid couplers in submillimeter and terahertz bands
    Niu, Zhongqian
    Zhang, Bo
    Li, Daotong
    Ji, Dongfeng
    Liu, Yang
    Feng, Yinian
    Zhou, Tianchi
    Zhang, Yaohui
    Fan, Yong
    FRONTIERS OF INFORMATION TECHNOLOGY & ELECTRONIC ENGINEERING, 2021, 22 (08) : 1104 - 1113
  • [9] A mechanical reliability study of 3-dB waveguide hybrid couplers in submillimeter and terahertz bands亚毫米和太赫兹波段3-dB分支波导定向耦合器的机械可靠性研究
    Zhongqian Niu
    Bo Zhang
    Daotong Li
    Dongfeng Ji
    Yang Liu
    Yinian Feng
    Tianchi Zhou
    Yaohui Zhang
    Yong Fan
    Frontiers of Information Technology & Electronic Engineering, 2021, 22 : 1104 - 1113