Swift heavy ion irradiation effects on tungsten carbide films

Tungsten carbide (WC) is an important material to study for various applications in extreme environments due to its radiation-resistant properties and high mechanical strength. Due to its excellent properties such as high hardness, strength, and wear resistance, it is also being considered lately as a plasma facing component in nuclear fusion reactors. To study the response of this material in extreme radiation environments, WC films prepared using RF sputtering technique were irradiated with 100 MeV Ag8+ ions in the present work. The irradiation was carried out at three different fluences: 3 x 1012, 1 x 1013, and 3 x 1013 ions/cm2. Rutherford Backscattering Spectrometry (RBS) was performed to determine the stoichiometry and thickness of the pristine film. To study the irradiation-induced modifications, glancing angle X-ray diffraction (GAXRD), field emission scanning elec-tron microscopy (FE-SEM), High Resolution Transmission Electron Microscopy (HRTEM), and Raman spectros-copy were performed on the pristine and irradiated samples. GAXRD of the pristine and irradiated samples revealed grain size reduction accompanied with reduced crystallinity with increasing ion fluence which was further manifested in HRTEM measurements and Raman spectroscopy measurements. Change in surface morphology due to the ion irradiation was observed in FE-SEM. These modifications have been explained using thermal-spike and TRIM simulations which showed that although the swift heavy ions irradiation did not result in track formation in the WC films, it caused radiation damage which may be attributed to the synergistic effect of electronic and nuclear energy loss mechanisms. These results might be crucial for a fundamental under-standing of the radiation resistance of WC thin films and its application in different radiation environments.