Comparing h-BN and MgO tunnel barriers for scaled magnetic tunnel junctions

被引:2
|
作者
Robertson, J. [1 ,2 ]
Naganuma, H. [2 ]
Lu, H. [3 ]
机构
[1] Univ Cambridge, Engn Dept, 9 J J Thomson Ave, Cambridge CB3 0FA, England
[2] Tohoku Univ, Ctr Spintron & Integrated Syst CSIS, Sendai 9808577, Japan
[3] Beihang Univ, Sch Integrated Circuit Sci, Beijing 100191, Peoples R China
关键词
spintronics; layered materials; magnetic tunnel junctions; scaling; MAGNETORESISTANCE;
D O I
10.35848/1347-4065/acb062
中图分类号
O59 [应用物理学];
学科分类号
摘要
Magnetic tunnel junctions (MTJ) with MgO/Fe based interfaces and perpendicular spin directions form the basis of present-day spin-transfer torque magnetic random-access memories. Many semiconductor devices, such as CMOS transistors, have undergone fundamental changes in materials design as dimensional scaling has progressed. Here, we consider how future scaling of MTJs might affect materials choices, comparing different tunnel barriers, such as 2D h-BN materials with existing MgO tunnel barriers. The different interfacial sites of h-BN on Ni or Co are compared in terms of their physisorptive or chemisorptive bonding and how this affects their transmission magnetoresistance, ability to create perpendicular magnetic isotropy, and unusual factors such as the "pillow effect." These effects are balanced by the beneficial chemical thermodynamics of the existing MgO barriers and MgO/Fe interfaces.
引用
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页数:8
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