Reconstruction algorithm using 2N+1 raw images for structured illumination microscopy

被引：0
作者：
Fang, Xiang [1 ]
Wen, Kai [1 ]
An, Sha [1 ]
Zheng, Juanjuan [1 ,2 ]
LI, Jianlang [1 ]
Zalevsky, Zeev [3 ,4 ]
Gao, Peng [1 ]
机构：
[1] Xidian Univ, Sch Phys, Xian 710071, Peoples R China
[2] Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China
[3] Bar Ilan Univ, Fac Engn, Ramat Gan, Israel
[4] Nano Technol Ctr, Ramat Gan, Israel
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2023年 / 40卷 / 04期
基金：
中国国家自然科学基金;
关键词：
EXCITATION MICROSCOPY; STIMULATED-EMISSION; RESOLUTION LIMIT; LIGHT;
D O I：
10.1364/JOSAA.483884
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This paper presents a structured illumination microscopy (SIM) reconstruction algorithm that allows the recon-struction of super-resolved images with 2N + 1 raw intensity images, with N being the number of structured illumination directions used. The intensity images are recorded after using a 2D grating for the projection fringe and a spatial light modulator to select two orthogonal fringe orientations and perform phase shifting. Super -resolution images can be reconstructed from the five intensity images, enhancing the imaging speed and reducing the photobleaching by 17%, compared to conventional two-direction and three-step phase-shifting SIM. We believe the proposed technique will be further developed and widely applied in many fields.(c) 2023 Optica Publishing Group
引用
收藏
页码：765 / 773
页数：9
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