Lifetime Improvement Method for Memristor-Based Hyperdimensional Computing Accelerator

被引:0
|
作者
Iwasaki, Tetsuro [1 ]
Shintani, Michihiro [1 ]
机构
[1] Kyoto Inst Technol, Grad Sch Sci & Technol, Matsugasaki,Sakyo Ku, Kyoto 6068585, Japan
来源
2023 IEEE INTERNATIONAL MEETING FOR FUTURE OF ELECTRON DEVICES, KANSAI, IMFEDK | 2023年
关键词
Hyperdimensional computing; Memristor; Dependability-aware design; Built-in self repair;
D O I
10.1109/IMFEDK60983.2023.10366339
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This study proposes a lifetime extension method for a hyperdimensional computing (HDC) inference accelerator implemented with memristors using error detection and self-repair techniques. The proposed method detects faulty memristors by calculating the sum of the memory values of memristors that store hypervectors in the HDC as a checksum and replacing the failed memristors with redundant memristors, thereby extending the lifetime of the HDC inference. When a memristor fails, the resistance is stacked at the minimum or maximum. This causes the checksum value to change when a failure occurs, which can be detected by comparison with the correct summed value. A numerical evaluation with a language-comparison task shows that the lifetime can be extended by five times while maintaining the same accuracy as in the case where no lifetime extension method is applied.
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页数:2
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