Risk Propagation Based Vector Profiling for High Coverage Dynamic IR-drop Analysis

被引:0
|
作者
Wen, Yihan [1 ]
Li, Juan [1 ]
Wang, Xiaoyi
机构
[1] Beijing Univ Technol, Beijing 100124, Peoples R China
来源
2023 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER AIDED DESIGN, ICCAD | 2023年
基金
中国国家自然科学基金;
关键词
Dynamic IR-drop analysis; Vector-based IR-drop analysis; Vector profiling; FAST POISSON SOLVER; POWER;
D O I
10.1109/ICCAD57390.2023.10323636
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Vector-based dynamic IR-drop analysis is a crucial aspect for enhancing yield in chip fabrication since it provides accurate IR-drop simulation with real waveform. To evaluate waveforms with a large duration from numerous working scenarios, vector profiling is widely used to increase scalability. In real cases, only a few windows selected by vector profiling are assessed by dynamic IR-drop analysis, rather than the whole waveform. Therefore, the coverage of vector profiling methods becomes a major concern, especially in EUV process node. The IR-drop locality effect on multi-pattern layers makes traditional vector profiling methods less robust. The real worst-case waveform window which may lead to silicon failure is frequently missed, which ultimately impacts the coverage of profiling. This paper proposes a novel risk propagation-based vector profiling method that achieves better estimation of IR-drop risk by considering the locality through examining not only the self-power-induced IR-drop but also the drop propagated from surrounding regions. The experimental results have shown that the proposed vector profiling achieved 4.3 times greater probability of covering the worst IR-drop window compared to traditional profiling. The proposed profiling also discovered additional IR-drop risky regions which were missed by traditional profiling.
引用
收藏
页数:8
相关论文
共 50 条
  • [1] Vector-based Dynamic IR-drop Prediction Using Machine Learning
    Chen, Jia-Xian
    Liu, Shi-Tang
    Wu, Yu-Tsung
    Wu, Mu-Ting
    Li, Chieo-Mo
    Chang, Norman
    Li, Ying-Shiun
    Chuang, Wen-Tze
    27TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, ASP-DAC 2022, 2022, : 202 - 207
  • [2] Emulating and Diagnosing IR-Drop by Using Dynamic SDF
    Peng, Ke
    Huang, Yu
    Guo, Ruifeng
    Cheng, Wu-Tung
    Tehranipoor, Mohammad
    2010 15TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC 2010), 2010, : 503 - +
  • [3] Current signature compression for IR-drop analysis
    Chaudhry, R
    Blaauw, D
    Panda, R
    Edwards, T
    37TH DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2000, 2000, : 162 - 167
  • [4] IR-Drop Analysis of Graphene-Based Power Distribution Networks
    Miryala, Sandeep
    Calimera, Andrea
    Macii, Enrico
    Poncino, Massimo
    DESIGN, AUTOMATION & TEST IN EUROPE (DATE 2012), 2012, : 81 - 86
  • [5] Dynamic IR-drop Prediction of At-speed Two-vector Tests Using Machine Learning
    Wu, Yu-Tsung
    Liang, Zhe-Jia
    Hsieh, Chao-Ho
    Yang, Yun-Feng
    Lee, Yung-Jen
    Li, James Chien-Mo
    Chang, Norman
    Li, Ying-Shiun
    Lin, Lang
    2024 INTERNATIONAL VLSI SYMPOSIUM ON TECHNOLOGY, SYSTEMS AND APPLICATIONS, VLSI TSA, 2024,
  • [6] Further Analysis of Laser-induced IR-drop
    da Cruz, William Souza
    Viera, Raphael
    Dutertre, Jean-Max
    Rigaud, Jean-Baptiste
    Hubert, Guillaume
    2021 IEEE 30TH ASIAN TEST SYMPOSIUM (ATS 2021), 2021, : 91 - 96
  • [7] Temperature Dependent IR-Drop Analysis in Graphene Nanoribbon Based Power Interconnect
    Bhattacharya, S.
    Das, D.
    Rahaman, H.
    JOURNAL OF NANO- AND ELECTRONIC PHYSICS, 2016, 8 (01)
  • [8] IR-Drop Based Electromigration Assessment Parametric Failure Chip-Scale Analysis
    Sukharev, Valeriy
    Huang, Xin
    Chen, Hai-Bao
    Tan, Sheldon X. -D.
    2014 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2014, : 428 - 433
  • [9] Effect of IR-Drop on path delay testing using statistical analysis
    Liu, Chunsheng
    Wu, Yang
    Huang, Yu
    PROCEEDINGS OF THE 16TH ASIAN TEST SYMPOSIUM, 2007, : 245 - +
  • [10] Realizable Reduction of RC Networks with Current Sources for Dynamic IR-Drop Analysis of Power Networks of SoCs
    Che, Hong Bo
    Park, Hyoun Soo
    Kim, Jin Wook
    Kim, Young Hwan
    IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2009, E92A (02) : 475 - 480