Learning-Based Dimensionality Reduction for Computing Compact and Effective Local Feature Descriptors

被引:5
作者
Dong, Hao [1 ]
Chen, Xieyuanli [1 ]
Dusmanu, Mihai [2 ]
Larsson, Viktor [3 ]
Pollefeys, Marc [2 ,4 ]
Stachniss, Cyrill [1 ,5 ,6 ]
机构
[1] Univ Bonn, Bonn, Germany
[2] Swiss Fed Inst Technol, Zurich, Switzerland
[3] Lund Univ, Lund, Sweden
[4] Microsoft Res, Redmond, WA USA
[5] Univ Oxford, Dept Engn Sci, Oxford, England
[6] Lamarr Inst Machine Learning & Artificial Intelli, Dortmund, Germany
来源
2023 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, ICRA | 2023年
关键词
SELECTION;
D O I
10.1109/ICRA48891.2023.10161381
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
A distinctive representation of image patches in form of features is a key component of many computer vision and robotics tasks, such as image matching, image retrieval, and visual localization. State-of-the-art descriptors, from handcrafted descriptors such as SIFT to learned ones such as HardNet, are usually high-dimensional; 128 dimensions or even more. The higher the dimensionality, the larger the memory consumption and computational time for approaches using such descriptors. In this paper, we investigate multi-layer perceptrons (MLPs) to extract low-dimensional but high-quality descriptors. We thoroughly analyze our method in unsupervised, self-supervised, and supervised settings, and evaluate the dimensionality reduction results on four representative descriptors. We consider different applications, including visual localization, patch verification, image matching and retrieval. The experiments show that our lightweight MLPs trained using supervised method achieve better dimensionality reduction than PCA. The lower-dimensional descriptors generated by our approach outperform the original higher-dimensional descriptors in downstream tasks, especially for the hand-crafted ones. The code is available at https://github.com/PRBonn/descriptor-dr.
引用
收藏
页码:6189 / 6195
页数:7
相关论文
共 35 条
[31]   L2-Net: Deep Learning of Discriminative Patch Descriptor in Euclidean Space [J].
Tian, Yurun ;
Fan, Bin ;
Wu, Fuchao .
30TH IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR 2017), 2017, :6128-6136
[32]   Long-Term Visual Localization Revisited [J].
Toft, Carl ;
Maddern, Will ;
Torii, Akihiko ;
Hammarstrand, Lars ;
Stenborg, Erik ;
Safari, Daniel ;
Okutomi, Masatoshi ;
Pollefeys, Marc ;
Sivic, Josef ;
Pajdla, Tomas ;
Kahl, Fredrik ;
Sattler, Torsten .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2022, 44 (04) :2074-2088
[33]  
van der Maaten L, 2008, J MACH LEARN RES, V9, P2579
[34]   Exploratory Factor Analysis: A Guide to Best Practice [J].
Watkins, Marley W. .
JOURNAL OF BLACK PSYCHOLOGY, 2018, 44 (03) :219-246
[35]  
Zagoruyko S, 2015, PROC CVPR IEEE, P4353, DOI 10.1109/CVPR.2015.7299064