A High Accuracy and Bandwidth Digital Background Calibration Technique for Timing Skew in TI-ADCs

被引:3
作者
Dang, Li [1 ]
Liu, Shubin [1 ]
Ding, Ruixue [1 ]
Shen, Yi [1 ]
Zhu, Zhangming [1 ]
机构
[1] Xidian Univ, Sch Microelect, Key Lab Analog Integrated Circuits & Syst, Minist Educ, Xian 710071, Peoples R China
关键词
Timing; Calibration; Bandwidth; Finite impulse response filters; Convergence; Standards; Signal to noise ratio; Analog-to-digital converters (ADCs); binary search; decimation-calibration-interpolation; effective bandwidth; time-interleaved (TI); timing-skew calibration; INTERLEAVED SAR ADC;
D O I
10.1109/TCSI.2023.3343415
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a digital background timing-skew calibration technique with high accuracy and bandwidth in time-interleaved (TI) analog-to-digital converters (ADCs). Compared with other calibration works, it features three highlights. Firstly, the proposed DCSD-based step-by-step and grouping calibration scheme can effectively improve the correction accuracy by minimizing the root mean square (RMS) value of the detected timing skews. Secondly, the linear compensation for a 13-taps FIR filter and the decimation-calibration-interpolation working pattern are used to expand the calibration effective bandwidth to the whole first Nyquist zone from different perspectives. Thirdly, the binary search is employed, instead of LMS algorithm, in order to meet the compensation requirement for FIR filter and improve the convergence speed and accuracy significantly in timing-skew detection. As a result, the proposed technique achieves the widest calibration bandwidth and higher accuracy compared to other fully digital calibration techniques while having the great convergence speed. Simulation model in MATLAB and FPGA-based hardware verification are employed to demonstrate its significant improvement on the performance and hardware overhead of the TI-ADCs. Finally, the proposed technique is employed in a 10-bit 2.5 GS/s 4-way TI-SAR ADC fabricated by standard CMOS 28nm process. The measurement results show that with the proposed technique, the SFDR and SNDR are improved by 18.9 and 17.9 dB at Nyquist frequency, respectively.
引用
收藏
页码:1061 / 1070
页数:10
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