ODD: ONE-CLASS ANOMALY DETECTION VIA THE DIFFUSION MODEL

被引:0
作者
Wang, He [1 ]
Dai, Longquan [1 ]
Tong, Jinglin [1 ]
Zhai, Yan [2 ]
机构
[1] Nanjing Univ Sci & Technol, Nanjing, Peoples R China
[2] Commun Univ China, Beijing, Peoples R China
来源
2023 IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING, ICIP | 2023年
基金
美国国家科学基金会;
关键词
Anomaly detection; diffusion models;
D O I
10.1109/ICIP49359.2023.10222162
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Anomaly detection identifies instances that deviate the distribution of the normal class. Recently, the diffusion models have shown great promise. Our research revealed that by training the diffusion model solely on normal data, it is able to transform both normal and anomalous samples into normal images. Employing this discovery, we propose ODD (One-Class Anomaly Detection via the Diffusion model), which consists of: a diffusion model to convert both normal and anomalous data into normal data, and a similarity network enhanced with outlier exposure to measure the semantic distance between the input and output of the diffusion model. If the score is low, the input is considered as an anomaly instance. The ODD is evaluated on a variety of datasets. Both qualitative and quantitative results demonstrate that our method outperforms existing state-of-the-art techniques.
引用
收藏
页码:3000 / 3004
页数:5
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